Susceptibility Scanning applied as IC Qualification Tool for Avoiding System Level Immunity Problems

Giorgi Muchaidze; Jayong Koo; T. Li; Q. Cai; J. Min; Lijun Han; David Johannes Pommerenke

Susceptibility Scanning applied as IC Qualification Tool for Avoiding System Level Immunity Problems

Giorgi Muchaidze, Jayong Koo, T. Li, Q. Cai, J. Min, Lijun Han, David Johannes Pommerenke

Publikation: Konferenzbeitrag › Paper › Begutachtung

Originalsprache	englisch
Publikationsstatus	Veröffentlicht - 2007
Extern publiziert	Ja
Veranstaltung	ICONIC'2007: 3rd International Conference on Electromagnetic Near-Field Characterization and Imaging - St. Louis, USA / Vereinigte Staaten Dauer: 27 Juni 2007 → 29 Juni 2007

Konferenz

Konferenz	ICONIC'2007
Land/Gebiet	USA / Vereinigte Staaten
Ort	St. Louis
Zeitraum	27/06/07 → 29/06/07

Dieses zitieren

@conference{ccffa9d8fa53479f919c8d34332cf6df,

title = "Susceptibility Scanning applied as IC Qualification Tool for Avoiding System Level Immunity Problems",

author = "Giorgi Muchaidze and Jayong Koo and T. Li and Q. Cai and J. Min and Lijun Han and Pommerenke, {David Johannes}",

year = "2007",

language = "English",

note = "ICONIC'2007 : 3rd International Conference on Electromagnetic Near-Field Characterization and Imaging ; Conference date: 27-06-2007 Through 29-06-2007",

}