Structural and morphological characterization of an organic multilayer photodiode with X-ray scattering techniques, electron microscopy and AFM

Alfred Neuhold; Stefanie Fladischer; Stefan Mitsche; Armin Moser; Heinz-Georg Flesch; Jiri Novak; Elke Kraker; Anja Haase; Detlef M. Smilgies; Werner Grogger; Roland Resel

Structural and morphological characterization of an organic multilayer photodiode with X-ray scattering techniques, electron microscopy and AFM

Alfred Neuhold, Stefanie Fladischer, Stefan Mitsche, Armin Moser, Heinz-Georg Flesch, Jiri Novak, Elke Kraker, Anja Haase, Detlef M. Smilgies, Werner Grogger, Roland Resel

Publikation: Konferenzbeitrag › Poster

Originalsprache	deutsch
Publikationsstatus	Veröffentlicht - 2010
Veranstaltung	ISOTEC Meeting 2010 - Reinischkogel Dauer: 25 Nov. 2010 → 26 Nov. 2010

Konferenz

Konferenz	ISOTEC Meeting 2010
Ort	Reinischkogel
Zeitraum	25/11/10 → 26/11/10

Dieses zitieren

@conference{77449c42e88d4d84aeba67ce6725fae6,

title = "Structural and morphological characterization of an organic multilayer photodiode with X-ray scattering techniques, electron microscopy and AFM",

author = "Alfred Neuhold and Stefanie Fladischer and Stefan Mitsche and Armin Moser and Heinz-Georg Flesch and Jiri Novak and Elke Kraker and Anja Haase and Smilgies, {Detlef M.} and Werner Grogger and Roland Resel",

year = "2010",

language = "deutsch",

note = "ISOTEC Meeting 2010 ; Conference date: 25-11-2010 Through 26-11-2010",

}

TY - CONF

T1 - Structural and morphological characterization of an organic multilayer photodiode with X-ray scattering techniques, electron microscopy and AFM

AU - Neuhold, Alfred

AU - Fladischer, Stefanie

AU - Mitsche, Stefan

AU - Moser, Armin

AU - Flesch, Heinz-Georg

AU - Novak, Jiri

AU - Kraker, Elke

AU - Haase, Anja

AU - Smilgies, Detlef M.

AU - Grogger, Werner

AU - Resel, Roland

PY - 2010

Y1 - 2010

M3 - Poster

T2 - ISOTEC Meeting 2010

Y2 - 25 November 2010 through 26 November 2010

ER -