State of the Art in GIS PD Diagnostics

Glenn Behrmann, Wojciech Koltunowicz, Uwe Schichler

Publikation: Beitrag in Buch/Bericht/KonferenzbandBeitrag in einem Konferenzband

Abstract

This paper presents the state of the art in GIS PD diagnostics. The guidelines for a risk assessment procedure on defects in GIS based on PD measurements are described. The procedure starts with sensitive PD measurements to detect critical defects and follows with an identification of the type of the defect and its location inside the GIS. This information, combined with other essential data from the manufacturer's experience and a trend analysis of the PD activity, is the base for the estimation of the criticality of the defects. Finally, the risk assessment is performed based on the estimated dielectric failure probability and failure consequences. To detect and eliminate critical insulation defects, PD monitoring systems are applied. The ultra-high frequency measurement method is used worldwide by GIS manufacturers during routine testing in the factory, during on-site commissioning and by utilities for continuous in-service monitoring.

Originalspracheenglisch
Titel2018 Condition Monitoring and Diagnosis, CMD 2018 - Proceedings
Herausgeber (Verlag)Institute of Electrical and Electronics Engineers
ISBN (elektronisch)9781538641262
DOIs
PublikationsstatusVeröffentlicht - 14 Nov 2018
Veranstaltung7th International Conference on Condition Monitoring and Diagnosis, CMD 2018 - Perth, Australien
Dauer: 23 Sep 201826 Sep 2018

Konferenz

Konferenz7th International Conference on Condition Monitoring and Diagnosis, CMD 2018
LandAustralien
OrtPerth
Zeitraum23/09/1826/09/18

ASJC Scopus subject areas

  • !!Computer Networks and Communications
  • !!Signal Processing
  • !!Energy Engineering and Power Technology
  • !!Safety, Risk, Reliability and Quality

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