Spectrum Analyzer-Based Phase Measurement for Near-Field EMI Scanning

Shubhankar Marathe*, Zongyi Chen, Kaustav Ghosh, Hamed Kajbaf, Stephan Frei, Morten Sorensen, David Johannes Pommerenke, Jin Min

*Korrespondierende/r Autor/in für diese Arbeit

Publikation: Beitrag in einer FachzeitschriftArtikel

Abstract

Often, electromagnetic interference (EMI) scanning applications require phase and magnitude information for the creation of equivalent radiation models and far-field predictions. Magnitude information can be obtained using a spectrum analyzer (SA), which is relatively inexpensive compared to phase resolving instruments such as vector network analyzers (VNAs) and oscilloscopes at tens of GHz. This paper introduces and optimizes a cost-effective SA-based phase measurement method and compares the results to a VNA and oscilloscope-based methods for EMI signal sources. The measured-phase distribution obtained from the three different instruments is additionally compared with the simulated phase determined from full-wave simulation. The three measurement methods are compared based on the type of signal spectrum to be measured, such as single or multiple frequencies, signals requiring low-resolution bandwidth measurements, or transient signal events. The SA-based phase measurement technique is designed to operate from 5 to 12 GHz. However, the system frequency bandwidth is limited only by the frequency bandwidth of the individual RF components used in the SA measurement system
Originalspracheenglisch
Aufsatznummer8743430
Seiten (von - bis)848 - 858
Seitenumfang11
FachzeitschriftIEEE Transactions on Electromagnetic Compatibility
Jahrgang62
Ausgabenummer3
DOIs
PublikationsstatusVeröffentlicht - Jun 2020
Extern publiziertJa

ASJC Scopus subject areas

  • !!Condensed Matter Physics
  • !!Atomic and Molecular Physics, and Optics
  • !!Electrical and Electronic Engineering

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