Software-based instrumentation for localization of faults caused by electrostatic discharge

Pratik Maheshwari*, Byong Su Seol, Jong Sung Lee, Jae Deok Lim, Sahra Sedigh, David Pommerenke

*Korrespondierende/r Autor/in für diese Arbeit

Publikation: Beitrag in Buch/Bericht/KonferenzbandBeitrag in einem Konferenzband

Abstract

Electrostatic discharge (ESD) is often the cause of system-level failure or malfunction of embedded systems. The underlying faults are difficult to localize, as the information gained from the hardware-based diagnostic methods typically in use lacks sufficient detail. The alternative proposed in this paper is software instrumentation that monitors key registers and flags to detect anomalies indicative of failure. In contrast to hardware-based techniques, which use invasive probes that can alter the very phenomena being studied; the proposed approach makes use of standard peripherals such as the serial or Ethernet port to monitor and record the effect of ESD. We illustrate the use of this software instrumentation technique in conjunction with a three-dimensional ESD injection system to produce a sensitivity map that visualizes the susceptibility of various segments of an embedded system to ESD.

Originalspracheenglisch
TitelProceedings - 2011 IEEE 13th International Symposium on High-Assurance Systems Engineering, HASE 2011
Seiten333-339
Seitenumfang7
DOIs
PublikationsstatusVeröffentlicht - 1 Dez 2011
Extern publiziertJa
Veranstaltung13th IEEE International Symposium on High Assurance Systems Engineering, HASE 2011 - Boca Raton, FL, USA / Vereinigte Staaten
Dauer: 10 Nov 201112 Nov 2011

Publikationsreihe

NameProceedings of IEEE International Symposium on High Assurance Systems Engineering
ISSN (Print)1530-2059

Konferenz

Konferenz13th IEEE International Symposium on High Assurance Systems Engineering, HASE 2011
LandUSA / Vereinigte Staaten
OrtBoca Raton, FL
Zeitraum10/11/1112/11/11

ASJC Scopus subject areas

  • Software
  • !!Safety, Risk, Reliability and Quality

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    Maheshwari, P., Seol, B. S., Lee, J. S., Lim, J. D., Sedigh, S., & Pommerenke, D. (2011). Software-based instrumentation for localization of faults caused by electrostatic discharge. in Proceedings - 2011 IEEE 13th International Symposium on High-Assurance Systems Engineering, HASE 2011 (S. 333-339). [6113916] (Proceedings of IEEE International Symposium on High Assurance Systems Engineering). https://doi.org/10.1109/HASE.2011.64