Software-based analysis of the effects of electrostatic discharge on embedded systems

Pratik Maheshwari*, Tianqi Li, Jong Sung Lee, Byong Su Seol, Sahra Sedigh, David Pommerenke

*Korrespondierende/r Autor/-in für diese Arbeit

Publikation: Beitrag in Buch/Bericht/KonferenzbandBeitrag in einem KonferenzbandBegutachtung

Abstract

This paper illustrates the use of software for monitoring and recording the effects of electrostatic discharge (ESD) on the operation of embedded systems, with the goal of facilitating root-cause analysis of resulting failures. Hard-warebased scanning techniques are typically used for analyzing the effect of ESD on systems by identifying physical coupling paths. This paper proposes software techniques that monitor registers and flags associated with peripherals of embedded systems to detect faults associated with the effects of ESD. A lightweight, cost-effective, and non-intrusive software tool has been developed that monitors and records the status of all registers associated with a designated peripheral under test, identifying the fault propagation caused by ESD in the system, and visually presenting the resulting errors. The tool has been used to detect and visually summarize ESD-induced errors on the SD card peripheral of the S3C2440 development board, using local injection and system-level scanning. Root-cause analysis of these faults can potentially assist in identification of coupling paths of electromagnetic interference, as well as determination of areas of the hardware that are more vulnerable to ESD.

Originalspracheenglisch
TitelProceedings - 35th Annual IEEE International Computer Software and Applications Conference, COMPSAC 2011
Seiten436-441
Seitenumfang6
DOIs
PublikationsstatusVeröffentlicht - 1 Nov. 2011
Extern publiziertJa
Veranstaltung35th Annual IEEE International Computer Software and Applications Conference, COMPSAC 2011 - Munich, Deutschland
Dauer: 18 Juli 201121 Juli 2011

Publikationsreihe

NameProceedings - International Computer Software and Applications Conference
ISSN (Print)0730-3157

Konferenz

Konferenz35th Annual IEEE International Computer Software and Applications Conference, COMPSAC 2011
Land/GebietDeutschland
OrtMunich
Zeitraum18/07/1121/07/11

ASJC Scopus subject areas

  • Software
  • Angewandte Informatik

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