Simulation of radiated emission during the design phase based on scattering parameter measurement

Publikation: Beitrag in Buch/Bericht/KonferenzbandBeitrag in einem KonferenzbandForschungBegutachtung

Abstract

As the electromagnetic compatibility (EMC) of IC products takes on greater significance for competitiveness, IC manufacturers are increasingly interested in evaluating the EMC performance of their products as soon as during the very first design phase without the need of prototypes. There are a number of approaches to predict radiated emissions of automotive components as defined in the CISPR25 standard. However, it can be concluded that none of them are suitable for continuous use by the circuit designer itself because they either need a manufactured prototype and a lab engineer, or lots of simulation time and resources. The designer is normally no EMC expert and does not want to deal with additional, complex simulation tools. This paper presents the generation and use of a simulation model which can easily be implemented in the design environment (e.g. Cadence Virtuoso) used by the designer and does not notably increase the simulation time. The transient data is post-processed with a Matlab script emulating an EMI test receiver.

Originalspracheenglisch
TitelEMC Compo 2015 - 2015 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits
Herausgeber (Verlag)Institute of Electrical and Electronics Engineers
Seiten228-231
Seitenumfang4
ISBN (elektronisch)9781467378963
DOIs
PublikationsstatusVeröffentlicht - 15 Dez 2015
Veranstaltung10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, EMC Compo 2015 - Edinburgh, Großbritannien / Vereinigtes Königreich
Dauer: 10 Nov 201513 Nov 2015

Konferenz

Konferenz10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, EMC Compo 2015
LandGroßbritannien / Vereinigtes Königreich
OrtEdinburgh
Zeitraum10/11/1513/11/15

Fingerprint

Scattering parameters
Electromagnetic compatibility
electromagnetic compatibility
scattering
simulation
prototypes
products
engineers
Engineers
resources
Networks (circuits)
receivers

ASJC Scopus subject areas

  • !!Electrical and Electronic Engineering
  • !!Radiation

Fields of Expertise

  • Information, Communication & Computing

Dies zitieren

Hackl, H., Winkler, G., & Deutschmann, B. (2015). Simulation of radiated emission during the design phase based on scattering parameter measurement. in EMC Compo 2015 - 2015 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (S. 228-231). [7358362] Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/EMCCompo.2015.7358362

Simulation of radiated emission during the design phase based on scattering parameter measurement. / Hackl, Herbert; Winkler, Gunter; Deutschmann, Bernd.

EMC Compo 2015 - 2015 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits. Institute of Electrical and Electronics Engineers, 2015. S. 228-231 7358362.

Publikation: Beitrag in Buch/Bericht/KonferenzbandBeitrag in einem KonferenzbandForschungBegutachtung

Hackl, H, Winkler, G & Deutschmann, B 2015, Simulation of radiated emission during the design phase based on scattering parameter measurement. in EMC Compo 2015 - 2015 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits., 7358362, Institute of Electrical and Electronics Engineers, S. 228-231, Edinburgh, Großbritannien / Vereinigtes Königreich, 10/11/15. https://doi.org/10.1109/EMCCompo.2015.7358362
Hackl H, Winkler G, Deutschmann B. Simulation of radiated emission during the design phase based on scattering parameter measurement. in EMC Compo 2015 - 2015 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits. Institute of Electrical and Electronics Engineers. 2015. S. 228-231. 7358362 https://doi.org/10.1109/EMCCompo.2015.7358362
Hackl, Herbert ; Winkler, Gunter ; Deutschmann, Bernd. / Simulation of radiated emission during the design phase based on scattering parameter measurement. EMC Compo 2015 - 2015 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits. Institute of Electrical and Electronics Engineers, 2015. S. 228-231
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