Serial block face scanning electron microscopy for three dimensional structural and elemental analysis of materials

Publikation: Konferenzbeitrag(Altdaten) Vortrag oder PräsentationForschung

Originalspracheenglisch
PublikationsstatusVeröffentlicht - 4 Sep 2011
VeranstaltungMCM 2011 - Urbino, Italien
Dauer: 4 Sep 20119 Sep 2011

Konferenz

KonferenzMCM 2011
LandItalien
OrtUrbino
Zeitraum4/09/119/09/11

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Dies zitieren

Serial block face scanning electron microscopy for three dimensional structural and elemental analysis of materials. / Zankel, Armin; Schröttner, Hartmuth; Reingruber, Herbert; Pölt, Peter.

2011. MCM 2011, Urbino, Italien.

Publikation: Konferenzbeitrag(Altdaten) Vortrag oder PräsentationForschung

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title = "Serial block face scanning electron microscopy for three dimensional structural and elemental analysis of materials",
author = "Armin Zankel and Hartmuth Schr{\"o}ttner and Herbert Reingruber and Peter P{\"o}lt",
year = "2011",
month = "9",
day = "4",
language = "English",
note = "MCM 2011 ; Conference date: 04-09-2011 Through 09-09-2011",

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TY - CONF

T1 - Serial block face scanning electron microscopy for three dimensional structural and elemental analysis of materials

AU - Zankel, Armin

AU - Schröttner, Hartmuth

AU - Reingruber, Herbert

AU - Pölt, Peter

PY - 2011/9/4

Y1 - 2011/9/4

M3 - (Old data) Lecture or Presentation

ER -