SE measurements with a TEM cell to study gasket reliability

Parisa Faraji, James L. Drewniak, Douglas S. McBain, David Pommerenke

Publikation: Beitrag in Buch/Bericht/KonferenzbandBeitrag in einem Konferenzband

Abstract

In this paper a near-field Shielding Effectiveness measurement approach for highly conductive gaskets while maintaining the interface is presented. SE measurements of initial gasket performance along with reliability data in hostile environments are vital for predicting a gasket performance in conjunction with specific joint surfaces. The TEM cell method reported herein offers an analytical approach for studying aging and reliability of gaskets and metal contact interfaces in place. Preserving the gasket-metal interface is critical throughout the testing and aging steps, which is an important advantage of this methodology.

Originalspracheenglisch
TitelProceedings - 2013 IEEE International Symposium on Electromagnetic Compatibility, EMC 2013
Seiten462-465
Seitenumfang4
DOIs
PublikationsstatusVeröffentlicht - 1 Dez 2013
Extern publiziertJa
Veranstaltung2013 IEEE International Symposium on Electromagnetic Compatibility, EMC 2013 - Denver, CO, USA / Vereinigte Staaten
Dauer: 5 Aug 20139 Aug 2013

Publikationsreihe

NameIEEE International Symposium on Electromagnetic Compatibility
ISSN (Print)1077-4076
ISSN (elektronisch)2158-1118

Konferenz

Konferenz2013 IEEE International Symposium on Electromagnetic Compatibility, EMC 2013
LandUSA / Vereinigte Staaten
OrtDenver, CO
Zeitraum5/08/139/08/13

ASJC Scopus subject areas

  • !!Condensed Matter Physics
  • !!Electrical and Electronic Engineering

Fingerprint Untersuchen Sie die Forschungsthemen von „SE measurements with a TEM cell to study gasket reliability“. Zusammen bilden sie einen einzigartigen Fingerprint.

Dieses zitieren