Reliable quantification of X-ray spectra using ζ-factors: from standards to geometry

Johanna Kraxner, Lukas Konrad, Daniel Knez, Angelina Orthacker, Sebastian Rauch, Manuel Paller, Gerald Kothleitner, Werner Grogger

Publikation: Beitrag in Buch/Bericht/KonferenzbandBeitrag in einem KonferenzbandForschungBegutachtung

Originalspracheenglisch
TitelASEM Workshop Advanced Electron Microscopy
Herausgeber (Verlag).
Seiten27-27
PublikationsstatusVeröffentlicht - 2015
Veranstaltung5th ASEM Workshop - Graz, Österreich
Dauer: 7 Jun 20158 Jun 2015

Konferenz

Konferenz5th ASEM Workshop
LandÖsterreich
OrtGraz
Zeitraum7/06/158/06/15

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • My Favorites

Dies zitieren

Kraxner, J., Konrad, L., Knez, D., Orthacker, A., Rauch, S., Paller, M., ... Grogger, W. (2015). Reliable quantification of X-ray spectra using ζ-factors: from standards to geometry. in ASEM Workshop Advanced Electron Microscopy (S. 27-27). ..

Reliable quantification of X-ray spectra using ζ-factors: from standards to geometry. / Kraxner, Johanna; Konrad, Lukas; Knez, Daniel; Orthacker, Angelina; Rauch, Sebastian; Paller, Manuel; Kothleitner, Gerald; Grogger, Werner.

ASEM Workshop Advanced Electron Microscopy. ., 2015. S. 27-27.

Publikation: Beitrag in Buch/Bericht/KonferenzbandBeitrag in einem KonferenzbandForschungBegutachtung

Kraxner, J, Konrad, L, Knez, D, Orthacker, A, Rauch, S, Paller, M, Kothleitner, G & Grogger, W 2015, Reliable quantification of X-ray spectra using ζ-factors: from standards to geometry. in ASEM Workshop Advanced Electron Microscopy. ., S. 27-27, Graz, Österreich, 7/06/15.
Kraxner J, Konrad L, Knez D, Orthacker A, Rauch S, Paller M et al. Reliable quantification of X-ray spectra using ζ-factors: from standards to geometry. in ASEM Workshop Advanced Electron Microscopy. . 2015. S. 27-27
@inproceedings{a28b2cd5ddb343eba9b4be0a21ad7196,
title = "Reliable quantification of X-ray spectra using ζ-factors: from standards to geometry",
author = "Johanna Kraxner and Lukas Konrad and Daniel Knez and Angelina Orthacker and Sebastian Rauch and Manuel Paller and Gerald Kothleitner and Werner Grogger",
year = "2015",
language = "English",
pages = "27--27",
booktitle = "ASEM Workshop Advanced Electron Microscopy",
publisher = ".",

}

TY - GEN

T1 - Reliable quantification of X-ray spectra using ζ-factors: from standards to geometry

AU - Kraxner, Johanna

AU - Konrad, Lukas

AU - Knez, Daniel

AU - Orthacker, Angelina

AU - Rauch, Sebastian

AU - Paller, Manuel

AU - Kothleitner, Gerald

AU - Grogger, Werner

PY - 2015

Y1 - 2015

M3 - Conference contribution

SP - 27

EP - 27

BT - ASEM Workshop Advanced Electron Microscopy

PB - .

ER -