Raman Imaging and Scanning Electron Microscopy (RISE) combined with EDX: correlativemicroscopy for different fields of science and technology

Armin Zankel

Raman Imaging and Scanning Electron Microscopy (RISE) combined with EDX: correlativemicroscopy for different fields of science and technology

Institut für Elektronenmikroskopie und Nanoanalytik (5190)

Publikation: Beitrag in Buch/Bericht/Konferenzband › Beitrag in einem Konferenzband

Originalsprache	englisch
Titel	Program MC2019/Mini lunchtime lecture: Carl Zeiss Microscopy GmbH
Seiten	62
Band	Program
Publikationsstatus	Veröffentlicht - 2019
Veranstaltung	Microscopy Conference 2019 : MC19 - Berlin, Deutschland Dauer: 1 Sept. 2019 → 6 Sept. 2019

Konferenz

Konferenz	Microscopy Conference 2019
Kurztitel	MC 2019
Land/Gebiet	Deutschland
Ort	Berlin
Zeitraum	1/09/19 → 6/09/19

ASJC Scopus subject areas

Werkstoffwissenschaften (insg.)

Fields of Expertise

Advanced Materials Science

Dieses zitieren

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title = "Raman Imaging and Scanning Electron Microscopy (RISE) combined with EDX: correlativemicroscopy for different fields of science and technology",

author = "Armin Zankel",

year = "2019",

language = "English",

volume = "Program",

pages = "62",

booktitle = "Program MC2019/Mini lunchtime lecture: Carl Zeiss Microscopy GmbH",

note = "Microscopy Conference 2019 : MC19, MC 2019 ; Conference date: 01-09-2019 Through 06-09-2019",

}

TY - GEN

T1 - Raman Imaging and Scanning Electron Microscopy (RISE) combined with EDX: correlativemicroscopy for different fields of science and technology

AU - Zankel, Armin

PY - 2019

Y1 - 2019

M3 - Conference paper

VL - Program

SP - 62

BT - Program MC2019/Mini lunchtime lecture: Carl Zeiss Microscopy GmbH

T2 - Microscopy Conference 2019

Y2 - 1 September 2019 through 6 September 2019

ER -