TY - JOUR
T1 - Quantitative Energy-Filtering Transmission Electron Microscopy (EFTEM)
AU - Hofer, Ferdinand
AU - Grogger, Werner
AU - Warbichler, Peter
AU - Papst, Ilse
PY - 2000/12/1
Y1 - 2000/12/1
N2 - Energy-filtered transmission electron microscopy (EFTEM) can be used to acquire elemental distribution images at high lateral resolution within short acquisition times. In this paper we discuss the unique advantages of EFTEM in terms of information content, resolution, sensitivity and detection limits. Applications in different fields of research, both in materials science and in life sciences, demonstrate the potential of EFTEM for characterizing nano-sized structures. In the first example, we show how secondary phases in a steel specimen can be easily detected by recording jump ratio images of the matrix element under rocking beam illumination. Secondly, we describe how elemental maps can be converted into concentration maps by calculating atomic ratio maps. Thirdly, we show how the energy-loss near edge structures (ELNES) can be used for mapping chemical bonding states thus differentiating between various modifications of an element. Finally, we present recent results on investigations of deposits in lung tissues and how useful EFTEM can be for defect analysis in semiconductor devices.
AB - Energy-filtered transmission electron microscopy (EFTEM) can be used to acquire elemental distribution images at high lateral resolution within short acquisition times. In this paper we discuss the unique advantages of EFTEM in terms of information content, resolution, sensitivity and detection limits. Applications in different fields of research, both in materials science and in life sciences, demonstrate the potential of EFTEM for characterizing nano-sized structures. In the first example, we show how secondary phases in a steel specimen can be easily detected by recording jump ratio images of the matrix element under rocking beam illumination. Secondly, we describe how elemental maps can be converted into concentration maps by calculating atomic ratio maps. Thirdly, we show how the energy-loss near edge structures (ELNES) can be used for mapping chemical bonding states thus differentiating between various modifications of an element. Finally, we present recent results on investigations of deposits in lung tissues and how useful EFTEM can be for defect analysis in semiconductor devices.
KW - Analytical electron microscopy
KW - ELNES
KW - Energy-filtering TEM
KW - Quantitative elemental maps
KW - Scatter diagram
UR - http://www.scopus.com/inward/record.url?scp=0000675224&partnerID=8YFLogxK
M3 - Article
AN - SCOPUS:0000675224
SN - 0026-3672
VL - 132
SP - 273
EP - 288
JO - Microchimica Acta
JF - Microchimica Acta
IS - 2-4
ER -