Progressive circumscribed sclerosis – a novel side-effect of immunotherapy with aluminium-adsorbed allergen extracts

El Shabrawi-Caelen; Peter Pölt; E. Aberer; W. Aberer

doi:10.1111/j.1398-9995.2009.01999.x

Progressive circumscribed sclerosis – a novel side-effect of immunotherapy with aluminium-adsorbed allergen extracts

El Shabrawi-Caelen, Peter Pölt, E. Aberer, W. Aberer

Institut für Elektronenmikroskopie und Nanoanalytik (5190)

Publikation: Beitrag in einer Fachzeitschrift › Artikel › Begutachtung

Originalsprache	englisch
Seiten (von - bis)	965-967
Fachzeitschrift	Allergy
Jahrgang	64
Ausgabenummer	6
DOIs	https://doi.org/10.1111/j.1398-9995.2009.01999.x
Publikationsstatus	Veröffentlicht - 2009

Treatment code (Nähere Zuordnung)

Application

Zugriff auf Dokument

10.1111/j.1398-9995.2009.01999.x

Microanalysis and in-situ studies using scanning electron microscopy
1/01/01 → 14/05/20
Projekt: Arbeitsgebiet

Dieses zitieren

@article{7a8158e3791348fa9c520bcd6ee65efc,

title = "Progressive circumscribed sclerosis – a novel side-effect of immunotherapy with aluminium-adsorbed allergen extracts",

author = "El Shabrawi-Caelen and Peter P{\"o}lt and E. Aberer and W. Aberer",

year = "2009",

doi = "10.1111/j.1398-9995.2009.01999.x",

language = "English",

volume = "64",

pages = "965--967",

journal = "Allergy",

issn = "1398-9995 ",

publisher = "Wiley-Blackwell",

number = "6",

}

TY - JOUR

T1 - Progressive circumscribed sclerosis – a novel side-effect of immunotherapy with aluminium-adsorbed allergen extracts

AU - Shabrawi-Caelen, El

AU - Pölt, Peter

AU - Aberer, E.

AU - Aberer, W.

PY - 2009

Y1 - 2009

U2 - 10.1111/j.1398-9995.2009.01999.x

DO - 10.1111/j.1398-9995.2009.01999.x

M3 - Article

SN - 1398-9995

VL - 64

SP - 965

EP - 967

JO - Allergy

JF - Allergy

IS - 6

ER -

Progressive circumscribed sclerosis – a novel side-effect of immunotherapy with aluminium-adsorbed allergen extracts

Treatment code (Nähere Zuordnung)

Zugriff auf Dokument

Projekte

Microanalysis and in-situ studies using scanning electron microscopy

Dieses zitieren