Polymer Thin Film Characterization: A Combined Approach by X-ray Reflectivity and Spectroscopic Ellipsometry

Heinz-Georg Flesch; Oliver Werzer; Paul Frank; Alexander Blümel; Jan Jakabovic; Jaroslav Kovac; Georg Jakopic; Roland Resel

Polymer Thin Film Characterization: A Combined Approach by X-ray Reflectivity and Spectroscopic Ellipsometry

Heinz-Georg Flesch, Oliver Werzer, Paul Frank, Alexander Blümel, Jan Jakabovic, Jaroslav Kovac, Georg Jakopic, Roland Resel

Institut für Festkörperphysik (5130)

Publikation: Konferenzbeitrag › Poster

Originalsprache	englisch
Publikationsstatus	Veröffentlicht - 2008
Veranstaltung	Winter School on Organic Electronics: The Role of Interfaces - Planneralm, Österreich Dauer: 27 Jan. 2008 → 31 Aug. 2008

Konferenz

Konferenz	Winter School on Organic Electronics: The Role of Interfaces
Land/Gebiet	Österreich
Ort	Planneralm
Zeitraum	27/01/08 → 31/08/08

Treatment code (Nähere Zuordnung)

Experimental

Dieses zitieren

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title = "Polymer Thin Film Characterization: A Combined Approach by X-ray Reflectivity and Spectroscopic Ellipsometry",

author = "Heinz-Georg Flesch and Oliver Werzer and Paul Frank and Alexander Bl{\"u}mel and Jan Jakabovic and Jaroslav Kovac and Georg Jakopic and Roland Resel",

year = "2008",

language = "English",

note = "Winter School on Organic Electronics: The Role of Interfaces ; Conference date: 27-01-2008 Through 31-08-2008",

}

TY - CONF

T1 - Polymer Thin Film Characterization: A Combined Approach by X-ray Reflectivity and Spectroscopic Ellipsometry

AU - Flesch, Heinz-Georg

AU - Werzer, Oliver

AU - Frank, Paul

AU - Blümel, Alexander

AU - Jakabovic, Jan

AU - Kovac, Jaroslav

AU - Jakopic, Georg

AU - Resel, Roland

PY - 2008

Y1 - 2008

M3 - Poster

T2 - Winter School on Organic Electronics: The Role of Interfaces

Y2 - 27 January 2008 through 31 August 2008

ER -