Pin specific ESD soft failure characterization using a fully automated set-up

Giorgi Maghlakelidze, Pengyu Wei, Wei Huang, Harald Gossner, David Pommerenke

Publikation: Beitrag in Buch/Bericht/KonferenzbandBeitrag in einem Konferenzband

Abstract

A fully automated system is developed for the systematic characterization of soft failure robustness for a DUT. The methodology is founded on software-based detection methods and applied to a USB3 interface. The approach is extendable to other interfaces and measurement-based failure detection methods.

Originalspracheenglisch
TitelElectrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2018
Herausgeber (Verlag)ESD Association
ISBN (elektronisch)1585373028
PublikationsstatusVeröffentlicht - 25 Okt 2018
Extern publiziertJa
Veranstaltung40th Annual Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2018 - Reno, USA / Vereinigte Staaten
Dauer: 23 Sep 201828 Sep 2018

Publikationsreihe

NameElectrical Overstress/Electrostatic Discharge Symposium Proceedings
Band2018-September
ISSN (Print)0739-5159

Konferenz

Konferenz40th Annual Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2018
LandUSA / Vereinigte Staaten
OrtReno
Zeitraum23/09/1828/09/18

ASJC Scopus subject areas

  • !!Electrical and Electronic Engineering

Dieses zitieren

Maghlakelidze, G., Wei, P., Huang, W., Gossner, H., & Pommerenke, D. (2018). Pin specific ESD soft failure characterization using a fully automated set-up. in Electrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2018 (Electrical Overstress/Electrostatic Discharge Symposium Proceedings; Band 2018-September). ESD Association.