Photocharge-modulated passive intermodulation on AgO/Ag junction in high-power microwave devices

Xiong Chen*, Yongning He, David J. Pommerenke, Jun Fan

*Korrespondierende/r Autor/in für diese Arbeit

Publikation: Beitrag in einer FachzeitschriftArtikel

Abstract

This letter studies the photocharge-modulated passive intermodulation (PIM) effect on the Ag2O/Ag contact junction. It is demonstrated that the photocharge with the parasitic parameters on the contact junction can modulate the electron transport process and make the PIM components changed with photoillumination. The linear RC constant can change the nonlinear current strength, under the periodical photostimulation, and PIM components will vary with the photopulses. In the experiment, by using a specially designed coaxial fixture to measure the PIM response with RC components on the contact junction, a semianalytical model for this photoeffect-modulated contact PIM is demonstrated.

Originalspracheenglisch
Aufsatznummer9001207
Seiten (von - bis)268-271
Seitenumfang4
FachzeitschriftIEEE Microwave and Wireless Components Letters
Jahrgang30
Ausgabenummer3
DOIs
PublikationsstatusVeröffentlicht - 1 Mär 2020

ASJC Scopus subject areas

  • !!Condensed Matter Physics
  • !!Electrical and Electronic Engineering

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