Performance enhancement of a modular test system for power semiconductors for HTOL testing by use of an embedded system

Roland Sleik, Michael Glavanovics, Klaus Krischan, Annette Mütze

Publikation: Beitrag in Buch/Bericht/KonferenzbandBeitrag in einem KonferenzbandForschungBegutachtung

Originalspracheenglisch
TitelProc. 19th European Conference on Power Electronics and Applications (EPE'17 ECCE Europe)
ErscheinungsortWarsaw
Herausgeber (Verlag)IEEE Xplore
Seiten1-8
PublikationsstatusVeröffentlicht - 11 Sep 2017

Publikationsreihe

NameEuropean Conference on Power Electronics and Applications

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Sleik, R., Glavanovics, M., Krischan, K., & Mütze, A. (2017). Performance enhancement of a modular test system for power semiconductors for HTOL testing by use of an embedded system. in Proc. 19th European Conference on Power Electronics and Applications (EPE'17 ECCE Europe) (S. 1-8). (European Conference on Power Electronics and Applications ). Warsaw: IEEE Xplore.

Performance enhancement of a modular test system for power semiconductors for HTOL testing by use of an embedded system. / Sleik, Roland; Glavanovics, Michael; Krischan, Klaus; Mütze, Annette.

Proc. 19th European Conference on Power Electronics and Applications (EPE'17 ECCE Europe). Warsaw : IEEE Xplore, 2017. S. 1-8 (European Conference on Power Electronics and Applications ).

Publikation: Beitrag in Buch/Bericht/KonferenzbandBeitrag in einem KonferenzbandForschungBegutachtung

Sleik, R, Glavanovics, M, Krischan, K & Mütze, A 2017, Performance enhancement of a modular test system for power semiconductors for HTOL testing by use of an embedded system. in Proc. 19th European Conference on Power Electronics and Applications (EPE'17 ECCE Europe). European Conference on Power Electronics and Applications , IEEE Xplore, Warsaw, S. 1-8.
Sleik R, Glavanovics M, Krischan K, Mütze A. Performance enhancement of a modular test system for power semiconductors for HTOL testing by use of an embedded system. in Proc. 19th European Conference on Power Electronics and Applications (EPE'17 ECCE Europe). Warsaw: IEEE Xplore. 2017. S. 1-8. (European Conference on Power Electronics and Applications ).
Sleik, Roland ; Glavanovics, Michael ; Krischan, Klaus ; Mütze, Annette. / Performance enhancement of a modular test system for power semiconductors for HTOL testing by use of an embedded system. Proc. 19th European Conference on Power Electronics and Applications (EPE'17 ECCE Europe). Warsaw : IEEE Xplore, 2017. S. 1-8 (European Conference on Power Electronics and Applications ).
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