PCB RF probe landing pads for multiline deembedding

Sebastian Sattler, Michael Ernst Gadringer, Fabrizio Gentili, Ahmad Bader Alothman Alterkawi, Wolfgang Bösch

Publikation: KonferenzbeitragPaperForschungBegutachtung

Abstract

The interface between a probe station and an active or passive component on a printed circuit board is of great importance for RF systems operating in the mm-wave frequency range. The landing pads provide the transition between a coplanar measurement device and a microstrip interface. This paper addresses the design issues of such landing pads focusing on finding the optimal design enabling multiline deembedding with a measurement error better than 0.1dB.
Originalspracheenglisch
Seiten209 - 212
DOIs
PublikationsstatusVeröffentlicht - 30 Jun 2017
Veranstaltung13th Conference on Ph.D. Research in Microelectronics and Electronics (PRIME) - Giardini Naxos, Taormina, Italien
Dauer: 12 Jun 201715 Jun 2017
http://prime2017.unisa.it/

Konferenz

Konferenz13th Conference on Ph.D. Research in Microelectronics and Electronics (PRIME)
KurztitelPRIME
LandItalien
OrtTaormina
Zeitraum12/06/1715/06/17
Internetadresse

Schlagwörter

  • Hochfrequenztechnik
  • Messtechnik
  • On-Wafer Messtechnik
  • Waferprober
  • PCB

Fields of Expertise

  • Information, Communication & Computing

Treatment code (Nähere Zuordnung)

  • Experimental

Dies zitieren

Sattler, S., Gadringer, M. E., Gentili, F., Alothman Alterkawi, A. B., & Bösch, W. (2017). PCB RF probe landing pads for multiline deembedding. 209 - 212. Beitrag in 13th Conference on Ph.D. Research in Microelectronics and Electronics (PRIME), Taormina, Italien. https://doi.org/10.1109/PRIME.2017.7974144

PCB RF probe landing pads for multiline deembedding. / Sattler, Sebastian; Gadringer, Michael Ernst; Gentili, Fabrizio; Alothman Alterkawi, Ahmad Bader; Bösch, Wolfgang.

2017. 209 - 212 Beitrag in 13th Conference on Ph.D. Research in Microelectronics and Electronics (PRIME), Taormina, Italien.

Publikation: KonferenzbeitragPaperForschungBegutachtung

Sattler, S, Gadringer, ME, Gentili, F, Alothman Alterkawi, AB & Bösch, W 2017, 'PCB RF probe landing pads for multiline deembedding' Beitrag in 13th Conference on Ph.D. Research in Microelectronics and Electronics (PRIME), Taormina, Italien, 12/06/17 - 15/06/17, S. 209 - 212. https://doi.org/10.1109/PRIME.2017.7974144
Sattler S, Gadringer ME, Gentili F, Alothman Alterkawi AB, Bösch W. PCB RF probe landing pads for multiline deembedding. 2017. Beitrag in 13th Conference on Ph.D. Research in Microelectronics and Electronics (PRIME), Taormina, Italien. https://doi.org/10.1109/PRIME.2017.7974144
Sattler, Sebastian ; Gadringer, Michael Ernst ; Gentili, Fabrizio ; Alothman Alterkawi, Ahmad Bader ; Bösch, Wolfgang. / PCB RF probe landing pads for multiline deembedding. Beitrag in 13th Conference on Ph.D. Research in Microelectronics and Electronics (PRIME), Taormina, Italien.
@conference{1ee45f73af864da2a73997974ff69ac2,
title = "PCB RF probe landing pads for multiline deembedding",
abstract = "The interface between a probe station and an active or passive component on a printed circuit board is of great importance for RF systems operating in the mm-wave frequency range. The landing pads provide the transition between a coplanar measurement device and a microstrip interface. This paper addresses the design issues of such landing pads focusing on finding the optimal design enabling multiline deembedding with a measurement error better than 0.1dB.",
keywords = "Hochfrequenztechnik, Messtechnik, On-Wafer Messtechnik, Waferprober, PCB",
author = "Sebastian Sattler and Gadringer, {Michael Ernst} and Fabrizio Gentili and {Alothman Alterkawi}, {Ahmad Bader} and Wolfgang B{\"o}sch",
year = "2017",
month = "6",
day = "30",
doi = "10.1109/PRIME.2017.7974144",
language = "English",
pages = "209 -- 212",
note = "13th Conference on Ph.D. Research in Microelectronics and Electronics (PRIME), PRIME ; Conference date: 12-06-2017 Through 15-06-2017",
url = "http://prime2017.unisa.it/",

}

TY - CONF

T1 - PCB RF probe landing pads for multiline deembedding

AU - Sattler, Sebastian

AU - Gadringer, Michael Ernst

AU - Gentili, Fabrizio

AU - Alothman Alterkawi, Ahmad Bader

AU - Bösch, Wolfgang

PY - 2017/6/30

Y1 - 2017/6/30

N2 - The interface between a probe station and an active or passive component on a printed circuit board is of great importance for RF systems operating in the mm-wave frequency range. The landing pads provide the transition between a coplanar measurement device and a microstrip interface. This paper addresses the design issues of such landing pads focusing on finding the optimal design enabling multiline deembedding with a measurement error better than 0.1dB.

AB - The interface between a probe station and an active or passive component on a printed circuit board is of great importance for RF systems operating in the mm-wave frequency range. The landing pads provide the transition between a coplanar measurement device and a microstrip interface. This paper addresses the design issues of such landing pads focusing on finding the optimal design enabling multiline deembedding with a measurement error better than 0.1dB.

KW - Hochfrequenztechnik

KW - Messtechnik

KW - On-Wafer Messtechnik

KW - Waferprober

KW - PCB

UR - http://ieeexplore.ieee.org/document/7974144/

U2 - 10.1109/PRIME.2017.7974144

DO - 10.1109/PRIME.2017.7974144

M3 - Paper

SP - 209

EP - 212

ER -