PCB RF probe landing pads for multiline deembedding

Sebastian Sattler, Michael Ernst Gadringer, Fabrizio Gentili, Ahmad Bader Alothman Alterkawi, Wolfgang Bösch

Publikation: KonferenzbeitragPaper

Abstract

The interface between a probe station and an active or passive component on a printed circuit board is of great importance for RF systems operating in the mm-wave frequency range. The landing pads provide the transition between a coplanar measurement device and a microstrip interface. This paper addresses the design issues of such landing pads focusing on finding the optimal design enabling multiline deembedding with a measurement error better than 0.1dB.
Originalspracheenglisch
Seiten209 - 212
DOIs
PublikationsstatusVeröffentlicht - 30 Jun 2017
Veranstaltung13th Conference on Ph.D. Research in Microelectronics and Electronics: PRIME 2017 - Giardini Naxos, Taormina, Italien
Dauer: 12 Jun 201715 Jul 2017
http://prime2017.unisa.it/

Konferenz

Konferenz13th Conference on Ph.D. Research in Microelectronics and Electronics
KurztitelPrime 2017
LandItalien
OrtTaormina
Zeitraum12/06/1715/07/17
Internetadresse

Schlagwörter

  • Hochfrequenztechnik
  • Messtechnik
  • On-Wafer Messtechnik
  • Waferprober
  • PCB

Fields of Expertise

  • Information, Communication & Computing

Treatment code (Nähere Zuordnung)

  • Experimental

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