Pattern Trails: Visual Analysis of Pattern Evolutions in Subspaces

Dominik Jäckle; Michael Hund; Michael Behrisch; Daniel A. Keim; T. Schreck

Pattern Trails: Visual Analysis of Pattern Evolutions in Subspaces

Dominik Jäckle, Michael Hund, Michael Behrisch, Daniel A. Keim, T. Schreck

Institut für Computer Graphik und Wissensvisualisierung (7110)

Publikation: Konferenzbeitrag › Paper › Begutachtung

Originalsprache	englisch
Seitenumfang	12
Publikationsstatus	Angenommen/In Druck - 2017
Veranstaltung	IEEE Conference on Visual Analytics Science and Technology: IEEE VAST 2017 - Phoenix, USA / Vereinigte Staaten Dauer: 1 Okt. 2017 → 6 Okt. 2017 http://ieeevis.org/year/2017/info/call-participation/vast-paper-types

Konferenz

Konferenz	IEEE Conference on Visual Analytics Science and Technology
Land/Gebiet	USA / Vereinigte Staaten
Ort	Phoenix
Zeitraum	1/10/17 → 6/10/17
Internetadresse	http://ieeevis.org/year/2017/info/call-participation/vast-paper-types

Fields of Expertise

Information, Communication & Computing

Andere Dateien und Links

https://dominikjaeckle.com/projects/2017/pattern_trails/paper/2017_jaeckle_pattern_trails.pdf

Dieses zitieren

@conference{5e8ba18339614dc6ad0d9d4ddba6f354,

title = "Pattern Trails: Visual Analysis of Pattern Evolutions in Subspaces",

keywords = "Data analysis, Data visualization, Density measurement, Feature extraction, Layout, Symmetric matrices, Visualization, Feature Detection/Selection, Matrix Visualization, Quality Metrics, Relational Data, Visual Quality Measures",

author = "Dominik J{\"a}ckle and Michael Hund and Michael Behrisch and Keim, {Daniel A.} and T. Schreck",

year = "2017",

language = "English",

note = "IEEE Conference on Visual Analytics Science and Technology : IEEE VAST 2017 ; Conference date: 01-10-2017 Through 06-10-2017",

url = "http://ieeevis.org/year/2017/info/call-participation/vast-paper-types",

}

TY - CONF

T1 - Pattern Trails: Visual Analysis of Pattern Evolutions in Subspaces

AU - Jäckle, Dominik

AU - Hund, Michael

AU - Behrisch, Michael

AU - Keim, Daniel A.

AU - Schreck, T.

PY - 2017

Y1 - 2017

KW - Data analysis

KW - Data visualization

KW - Density measurement

KW - Feature extraction

KW - Layout

KW - Symmetric matrices

KW - Visualization

KW - Feature Detection/Selection

KW - Matrix Visualization

KW - Quality Metrics

KW - Relational Data

KW - Visual Quality Measures

UR - https://dominikjaeckle.com/projects/2017/pattern_trails/paper/2017_jaeckle_pattern_trails.pdf

M3 - Paper

T2 - IEEE Conference on Visual Analytics Science and Technology

Y2 - 1 October 2017 through 6 October 2017

ER -