Emission source microscopy (ESM) technique can be used for localization and characterization of electromagnetic interference sources by measuring the magnitude and phase of the electromagnetic field in the far-field zone. This article presents a method which uses ESM to locate sources of passive intermodulation (PIM). Compared to the traditional methods of PIM source localization techniques including mechanical manipulation of potential sources and near-field scanning, the proposed ESM-based approach does not require access to the devices under test allowing to detect the PIM sources at relatively large distances. Moreover, the influence of background PIM generated by surrounding environment can be reduced by ESM focusing. The high-quality maps of reconstructed PIM sources can be obtained by using ESM. The feasibility of manual sparse ESM scanning, which is more practical in realistic settings is also demonstrated.
|Seiten (von - bis)||266-271|
|Fachzeitschrift||IEEE Transactions on Electromagnetic Compatibility|
|Publikationsstatus||Veröffentlicht - 1 Feb 2020|
ASJC Scopus subject areas
- !!Atomic and Molecular Physics, and Optics
- !!Condensed Matter Physics
- !!Electrical and Electronic Engineering