Passive Intermodulation Source Localization Based on Emission Source Microscopy

Shaohui Yong*, Sen Yang, Ling Zhang, Xiong Chen, David J. Pommerenke, Victor Khilkevich

*Korrespondierende/r Autor/in für diese Arbeit

Publikation: Beitrag in einer FachzeitschriftArtikel

Abstract

Emission source microscopy (ESM) technique can be used for localization and characterization of electromagnetic interference sources by measuring the magnitude and phase of the electromagnetic field in the far-field zone. This article presents a method which uses ESM to locate sources of passive intermodulation (PIM). Compared to the traditional methods of PIM source localization techniques including mechanical manipulation of potential sources and near-field scanning, the proposed ESM-based approach does not require access to the devices under test allowing to detect the PIM sources at relatively large distances. Moreover, the influence of background PIM generated by surrounding environment can be reduced by ESM focusing. The high-quality maps of reconstructed PIM sources can be obtained by using ESM. The feasibility of manual sparse ESM scanning, which is more practical in realistic settings is also demonstrated.

Originalspracheenglisch
Aufsatznummer8844066
Seiten (von - bis)266-271
Seitenumfang6
FachzeitschriftIEEE Transactions on Electromagnetic Compatibility
Jahrgang62
Ausgabenummer1
DOIs
PublikationsstatusVeröffentlicht - 1 Feb 2020
Extern publiziertJa

ASJC Scopus subject areas

  • !!Atomic and Molecular Physics, and Optics
  • !!Condensed Matter Physics
  • !!Electrical and Electronic Engineering

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