Paper Coating Layer Analysis Based on Computer Vision Methods

Michael Donoser, Mario Wiltsche, Horst Bischof, Wolfgang Bauer

Publikation: Beitrag in Buch/Bericht/Konferenzband › Beitrag in einem Konferenzband › Begutachtung

Originalsprache	englisch
Titel	International Conference on Quality Control by Artificial Vision
Herausgeber (Verlag)	.
Seiten	39-44
ISBN (Print)	4-9902515-0-4
Publikationsstatus	Veröffentlicht - 2005
Veranstaltung	International Conference on Quality Control by Artificial Vision - Nagoya, Aichi, Japan Dauer: 18 Mai 2005 → 20 Mai 2005

Konferenz	International Conference on Quality Control by Artificial Vision
Land/Gebiet	Japan
Ort	Nagoya, Aichi
Zeitraum	18/05/05 → 20/05/05

Andere Dateien und Links

3D-Structural Analysis of digitilized Paper using Computer Vision methods
Hirn, U., Donoser, M. & Bischof, H.
1/10/03 → 31/08/08
Projekt: Forschungsprojekt
Digitalisierte Papierstruktur - Digitalisierte Papierstruktur
Derflinger, C., Donoser, M., Hirn, U., Kritzinger, J., Wiltsche, M. & Bauer, W.
1/10/02 → 30/09/08
Projekt: Forschungsprojekt

@inproceedings{3d05fa08d4eb41e4ab9c21c841ba6a6e,

title = "Paper Coating Layer Analysis Based on Computer Vision Methods",

author = "Michael Donoser and Mario Wiltsche and Horst Bischof and Wolfgang Bauer",

year = "2005",

language = "English",

isbn = "4-9902515-0-4",

pages = "39--44",

booktitle = "International Conference on Quality Control by Artificial Vision",

publisher = ".",

note = "International Conference on Quality Control by Artificial Vision ; Conference date: 18-05-2005 Through 20-05-2005",

}

TY - GEN

T1 - Paper Coating Layer Analysis Based on Computer Vision Methods

AU - Donoser, Michael

AU - Wiltsche, Mario

AU - Bischof, Horst

AU - Bauer, Wolfgang

PY - 2005

Y1 - 2005

UR - http://www.koshi-lab.sccs.chukyo-u.ac.jp/QCAV2005/

M3 - Conference paper

SN - 4-9902515-0-4

SP - 39

EP - 44

BT - International Conference on Quality Control by Artificial Vision

PB - .

T2 - International Conference on Quality Control by Artificial Vision

Y2 - 18 May 2005 through 20 May 2005

ER -