Orthogonal loops probe design and characterization for near-field measurement

Tun Li, Yong Cheh Ho, David Pommerenke

Publikation: Beitrag in einer FachzeitschriftKonferenzartikel

Abstract

Near-field probes are often used to measure the electric and magnetic fields above a printed circuit board in order to identify the sources and coupling paths of an electromagnetic interference (EMI) problem. It is the objective of this paper to propose a rapid E-, Hx-Hy-and circular H-fields measurement using an orthogonal loops probe design. The effects of this probe are analyzed using full-wave simulations and measurements.

Originalspracheenglisch
Aufsatznummer4652138
FachzeitschriftIEEE International Symposium on Electromagnetic Compatibility
Jahrgang2008-January
DOIs
PublikationsstatusVeröffentlicht - 1 Jan 2008
Extern publiziertJa
Veranstaltung2008 IEEE International Symposium on Electromagnetic Compatibility: EMC 2008 - Detroit, USA / Vereinigte Staaten
Dauer: 18 Aug 200822 Aug 2008

ASJC Scopus subject areas

  • !!Condensed Matter Physics
  • !!Electrical and Electronic Engineering

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