Optical constants modelling in silicon nitride membrane transiently excited by EUV radiation

R. Mincigrucci, D. Naumenko, L. Foglia, I. Nikolov, E. Pedersoli, E. Principi, A. Simoncig, M. Kiskinova, C. Masciovecchio, F. Bencivenga, F. Capotondi

Publikation: Beitrag in einer FachzeitschriftArtikel

Abstract

We hereby report on a set of transient optical reflectivity and transmissivity measurements performed on silicon nitride thin membranes excited by extreme ultraviolet (EUV) radiation from a free electron laser (FEL). Experimental data were acquired as a function of the membrane thickness, FEL fluence and probe polarization. The time dependence of the refractive index, retrieved using Jones matrix formalism, encodes the dynamics of electron and lattice excitation following the FEL interaction. The observed dynamics are interpreted in the framework of a two temperature model, which permits to extract the relevant time scales and magnitudes of the processes. We also found that in order to explain the experimental data thermo-optical e ects and inter-band filling must be phenomenologically added to the model.

Originalspracheenglisch
Seiten (von - bis)11877-11888
Seitenumfang12
FachzeitschriftOptics Express
Jahrgang26
Ausgabenummer9
DOIs
PublikationsstatusVeröffentlicht - 30 Apr 2018
Extern publiziertJa

ASJC Scopus subject areas

  • !!Atomic and Molecular Physics, and Optics

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