On the relationship between the structure and the barrier performance of plasma deposited silicon dioxide-like films

Anna Maria Coclite*, Antonella Milella, Riccardo d'Agostino, Fabio Palumbo

*Korrespondierende/r Autor/-in für diese Arbeit

Publikation: Beitrag in einer FachzeitschriftArtikelBegutachtung

Abstract

Silicon dioxide-like barrier films were deposited by plasma enhanced chemical vapor deposition from different siloxane and silane precursors. The variation of the precursor was investigated as a route to obtain silicon dioxide-like films with different structures, densities and hence barrier performances.Although the films were characterized by the same elemental composition, some differences in film density and porosity were evidenced from optical properties measurements and from the shift of the SiOSi infrared absorption band position. These differences were correlated with film microstructure and in turn with barrier performances. The results confirmed that films with high density and low porosity performed better as single inorganic barrier layers for food-packaging.

Originalspracheenglisch
Seiten (von - bis)4012-4017
Seitenumfang6
FachzeitschriftSurface and Coatings Technology
Jahrgang204
Ausgabenummer24
DOIs
PublikationsstatusVeröffentlicht - 1 Sept. 2010
Extern publiziertJa

ASJC Scopus subject areas

  • Allgemeine Chemie
  • Physik der kondensierten Materie
  • Oberflächen und Grenzflächen
  • Oberflächen, Beschichtungen und Folien
  • Werkstoffchemie

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