On the Duality of Probing and Fault Attacks

Berndt M. Gammel, Stefan Mangard

Publikation: Beitrag in einer FachzeitschriftArtikelForschungBegutachtung

Originalspracheenglisch
Seiten (von - bis)483-493
FachzeitschriftJournal of electronic testing
Jahrgang26
Ausgabenummer4
DOIs
PublikationsstatusVeröffentlicht - 2010

Fields of Expertise

  • Information, Communication & Computing

Dies zitieren

On the Duality of Probing and Fault Attacks. / Gammel, Berndt M.; Mangard, Stefan.

in: Journal of electronic testing, Jahrgang 26, Nr. 4, 2010, S. 483-493.

Publikation: Beitrag in einer FachzeitschriftArtikelForschungBegutachtung

Gammel, Berndt M. ; Mangard, Stefan. / On the Duality of Probing and Fault Attacks. in: Journal of electronic testing. 2010 ; Jahrgang 26, Nr. 4. S. 483-493.
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