On the Duality of Probing and Fault Attacks

Publikation: Beitrag in einer Fachzeitschrift › Artikel › Begutachtung

Originalsprache	englisch
Seiten (von - bis)	483-493
Fachzeitschrift	Journal of Electronic Testing
Jahrgang	26
Ausgabenummer	4
DOIs	https://doi.org/10.1007/s10836-010-5160-0
Publikationsstatus	Veröffentlicht - 2010

Fields of Expertise

@article{4ab374e916b44153aa3d494d9d9837ab,

title = "On the Duality of Probing and Fault Attacks",

author = "Gammel, {Berndt M.} and Stefan Mangard",

year = "2010",

doi = "10.1007/s10836-010-5160-0",

language = "English",

volume = "26",

pages = "483--493",

journal = "Journal of Electronic Testing ",

issn = "1573-0727",

publisher = "Springer Science+Business Media B.V ",

number = "4",

}

TY - JOUR

T1 - On the Duality of Probing and Fault Attacks

AU - Gammel, Berndt M.

AU - Mangard, Stefan

PY - 2010

Y1 - 2010

UR - http://www.springer.com/engineering/circuits+%26+systems/journal/10836

U2 - 10.1007/s10836-010-5160-0

DO - 10.1007/s10836-010-5160-0

M3 - Article

SN - 1573-0727

VL - 26

SP - 483

EP - 493

JO - Journal of Electronic Testing

JF - Journal of Electronic Testing

IS - 4

ER -