TY - GEN
T1 - On different methods to combine cable information into near-field data for far-field estimation
AU - Kam, Keong
AU - Radchenko, Andriy
AU - Pommerenke, David
PY - 2012/12/12
Y1 - 2012/12/12
N2 - Near-field scanning is often used to solve EMC problems. Aside from the purpose of visualization of near-fields, measured near-field data can be used to estimate far-field. One of many challenges associated with using near-field to far-field transform (NFFFT) technique for EMC application is the handling of attached cables. The objective of this investigation is to evaluate different methods to add cable information to the near-field data for far-field estimation. The investigation is carried out using numerical experiments in EMCoS EMC studio, which is a commercial MoM (Method of Moment) tool for EM simulation. Measurement results from a test structure are also presented to validate the simulation results.
AB - Near-field scanning is often used to solve EMC problems. Aside from the purpose of visualization of near-fields, measured near-field data can be used to estimate far-field. One of many challenges associated with using near-field to far-field transform (NFFFT) technique for EMC application is the handling of attached cables. The objective of this investigation is to evaluate different methods to add cable information to the near-field data for far-field estimation. The investigation is carried out using numerical experiments in EMCoS EMC studio, which is a commercial MoM (Method of Moment) tool for EM simulation. Measurement results from a test structure are also presented to validate the simulation results.
UR - http://www.scopus.com/inward/record.url?scp=84870699586&partnerID=8YFLogxK
U2 - 10.1109/ISEMC.2012.6351767
DO - 10.1109/ISEMC.2012.6351767
M3 - Conference paper
AN - SCOPUS:84870699586
SN - 9781467320610
T3 - IEEE International Symposium on Electromagnetic Compatibility
SP - 294
EP - 300
BT - EMC 2012 - 2012 IEEE International Symposium on Electromagnetic Compatibility, Final Program
T2 - 2012 IEEE International Symposium on Electromagnetic Compatibility
Y2 - 5 August 2012 through 10 August 2012
ER -