Numerical evaluation of Near-Field to Far-Field transformation robustness for EMC

Andriy Radchenko*, Ji Zhang, Keong Kam, David Pommerenke

*Korrespondierende/r Autor/in für diese Arbeit

Publikation: Beitrag in Buch/Bericht/KonferenzbandBeitrag in einem Konferenzband

Abstract

Near-Field (NF) to Far-Field (FF) transformation techniques are widely used for antenna radiation problems. To perform a NF to FF or a NF to NF transformation for EMC applications, the large frequency range, and a weak signals will require data in the reactive near field. In principle, the transformation can be performed if all sources are confined in the scanned area using Huygens' Principle, which requires knowledge of the exact phase and magnitude data of measured fields. In reality, this cannot be achieved, due to uncertainties in the field probe measurements, presence of active and passive cables and limited scan areas. Thus, it is attempted to perform a transformation based on an incomplete and uncertain data set. Results of a numerical simulation tool usage for NF to FF transformation based on NF-Scanning system measured data are demonstrated.

Originalspracheenglisch
TitelEMC 2012 - 2012 IEEE International Symposium on Electromagnetic Compatibility, Final Program
Seiten605-611
Seitenumfang7
DOIs
PublikationsstatusVeröffentlicht - 12 Dez 2012
Extern publiziertJa
Veranstaltung2012 IEEE International Symposium on Electromagnetic Compatibility: EMC 2012 - Pittsburgh, USA / Vereinigte Staaten
Dauer: 5 Aug 201210 Aug 2012

Publikationsreihe

NameIEEE International Symposium on Electromagnetic Compatibility
ISSN (Print)1077-4076
ISSN (elektronisch)2158-1118

Konferenz

Konferenz2012 IEEE International Symposium on Electromagnetic Compatibility
LandUSA / Vereinigte Staaten
OrtPittsburgh
Zeitraum5/08/1210/08/12

ASJC Scopus subject areas

  • !!Condensed Matter Physics
  • !!Electrical and Electronic Engineering

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