TY - GEN
T1 - Near field probe for detecting resonances in EMC application
AU - Xiao, Jiang
AU - Liu, Dazhao
AU - Pommerenke, David
AU - Huang, Wei
AU - Shao, Peng
AU - Li, Xiang
AU - Min, Jin
AU - Muchaidze, Giorgi
PY - 2010/8/2
Y1 - 2010/8/2
N2 - Resonances degrade the product's EMI or immunity performance at resonance frequencies. Near field scanning techniques, like EMI scanning or susceptibility scanning determine the local behaviour, but fail to connect the local behaviour to the system level behaviour. Resonating structures form part of the coupling paths, i.e., identifying them will aid in understanding system level behaviour of products. In this article, a near field probe (patent pending) is proposed to detecting the resonances frequencies, locations or resonating structures and their Q-factors. The probe is suitable for integration into an automatic scanning system for analysing resonances of PCBs, cables, structural elements etc. The mechanism of the probe has been verified with full wave tools (CST MWS and Ansoft HESS). Two samples of application are presented.
AB - Resonances degrade the product's EMI or immunity performance at resonance frequencies. Near field scanning techniques, like EMI scanning or susceptibility scanning determine the local behaviour, but fail to connect the local behaviour to the system level behaviour. Resonating structures form part of the coupling paths, i.e., identifying them will aid in understanding system level behaviour of products. In this article, a near field probe (patent pending) is proposed to detecting the resonances frequencies, locations or resonating structures and their Q-factors. The probe is suitable for integration into an automatic scanning system for analysing resonances of PCBs, cables, structural elements etc. The mechanism of the probe has been verified with full wave tools (CST MWS and Ansoft HESS). Two samples of application are presented.
UR - http://www.scopus.com/inward/record.url?scp=77955002382&partnerID=8YFLogxK
U2 - 10.1109/APEMC.2010.5475739
DO - 10.1109/APEMC.2010.5475739
M3 - Conference paper
AN - SCOPUS:77955002382
SN - 9781424456215
T3 - 2010 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2010
SP - 243
EP - 246
BT - 2010 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2010
T2 - 2010 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2010
Y2 - 12 April 2010 through 16 April 2010
ER -