Near Field Measurements to Predict the Electromagnetic Emission of Integrated Circuits

Publikation: Beitrag in Buch/Bericht/Konferenzband › Beitrag in einem Konferenzband › Begutachtung

Originalsprache	englisch
Titel	International Workshop on Electromagnetic Compatibility of Integrated Circuits
Herausgeber (Verlag)	.
Seiten	27-32
Publikationsstatus	Veröffentlicht - 2005

Fields of Expertise

@inproceedings{6928341a3c894170b79ab0d8508160c5,

title = "Near Field Measurements to Predict the Electromagnetic Emission of Integrated Circuits",

author = "Bernd Deutschmann and H. Pitsch and G. Langer",

year = "2005",

language = "English",

pages = "27--32",

booktitle = "International Workshop on Electromagnetic Compatibility of Integrated Circuits",

publisher = ".",

}