Nanoanalytical characterization of organic devices by electron microscopy & atomic force

Stefanie Fladischer, Stefan Mitsche, A.G. Neuhold, E. Kraker, A. Haase, B. Lamprecht, R. Resel, Werner Grogger

Publikation: Konferenzbeitrag › Poster

Originalsprache	englisch
Publikationsstatus	Veröffentlicht - 2010
Veranstaltung	International Conference of Physics Students - Graz Dauer: 17 Aug. 2010 → 23 Aug. 2010

Konferenz	International Conference of Physics Students
Ort	Graz
Zeitraum	17/08/10 → 23/08/10

Treatment code (Nähere Zuordnung)

@conference{54fdcba72ada4618aee1af9c018b1288,

title = "Nanoanalytical characterization of organic devices by electron microscopy & atomic force",

author = "Stefanie Fladischer and Stefan Mitsche and A.G. Neuhold and E. Kraker and A. Haase and B. Lamprecht and R. Resel and Werner Grogger",

year = "2010",

language = "English",

note = "International Conference of Physics Students ; Conference date: 17-08-2010 Through 23-08-2010",

}

TY - CONF

T1 - Nanoanalytical characterization of organic devices by electron microscopy & atomic force

AU - Fladischer, Stefanie

AU - Mitsche, Stefan

AU - Neuhold, A.G.

AU - Kraker, E.

AU - Haase, A.

AU - Lamprecht, B.

AU - Resel, R.

AU - Grogger, Werner

PY - 2010

Y1 - 2010

M3 - Poster

T2 - International Conference of Physics Students

Y2 - 17 August 2010 through 23 August 2010

ER -