Microbiologically influenced corrosion (MIC) of steel – a study using correlative SEM, EDX and Raman microscopy

Thomas Planko; Harald Matthias Fitzek; Stefanie Eichinger; Johannes Rattenberger; Guenther Koraimann; Hartmuth Schröttner

Microbiologically influenced corrosion (MIC) of steel – a study using correlative SEM, EDX and Raman microscopy

Thomas Planko, Harald Matthias Fitzek, Stefanie Eichinger, Johannes Rattenberger, Guenther Koraimann, Hartmuth Schröttner

Publikation: Konferenzbeitrag › Abstract

Originalsprache	englisch
Publikationsstatus	Veröffentlicht - 2020
Veranstaltung	Virtual Early Career European Microscopy Congress 2020: EMC 2020 - Virtuell, Großbritannien / Vereinigtes Königreich Dauer: 24 Nov. 2020 → 26 Nov. 2020 https://www.emc2020.eu/virtual-conference/conference-programme.html

Konferenz

Konferenz	Virtual Early Career European Microscopy Congress 2020
Kurztitel	EMC 2020
Land/Gebiet	Großbritannien / Vereinigtes Königreich
Zeitraum	24/11/20 → 26/11/20
Internetadresse	https://www.emc2020.eu/virtual-conference/conference-programme.html

Fields of Expertise

Advanced Materials Science

Treatment code (Nähere Zuordnung)

Basic - Fundamental (Grundlagenforschung)

Andere Dateien und Links

https://www.emc2020.eu/virtual-conference/congress-booklet-app.html

Dieses zitieren

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title = "Microbiologically influenced corrosion (MIC) of steel – a study using correlative SEM, EDX and Raman microscopy",

author = "Thomas Planko and Fitzek, {Harald Matthias} and Stefanie Eichinger and Johannes Rattenberger and Guenther Koraimann and Hartmuth Schr{\"o}ttner",

year = "2020",

language = "English",

note = "Virtual Early Career European Microscopy Congress 2020 : EMC 2020, EMC 2020 ; Conference date: 24-11-2020 Through 26-11-2020",

url = "https://www.emc2020.eu/virtual-conference/conference-programme.html",

}

TY - CONF

T1 - Microbiologically influenced corrosion (MIC) of steel – a study using correlative SEM, EDX and Raman microscopy

AU - Planko, Thomas

AU - Fitzek, Harald Matthias

AU - Eichinger, Stefanie

AU - Rattenberger, Johannes

AU - Koraimann, Guenther

AU - Schröttner, Hartmuth

PY - 2020

Y1 - 2020

UR - https://www.emc2020.eu/virtual-conference/congress-booklet-app.html

M3 - Abstract

T2 - Virtual Early Career European Microscopy Congress 2020

Y2 - 24 November 2020 through 26 November 2020

ER -