Abstract
Parameters which cause the poor reproducibility of system level ESD tests have been identified: simulator calibration methodology and insufficient simulator specifications. Results of round robin tests we performed at three laboratories are reported. A better calibration methodology for ESD current measurement and additional simulator specifications for output current and radiated fields are proposed.
Originalsprache | englisch |
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Seiten (von - bis) | 29-39 |
Seitenumfang | 11 |
Fachzeitschrift | Electrical Overstress Electrostatic Discharge Symposium Proceedings |
Publikationsstatus | Veröffentlicht - 1 Dez. 1998 |
Extern publiziert | Ja |
Veranstaltung | 20th Annual Electrical Overstress/Electrostatic Discharge Symposium: EOS/ESD 1998 - Reno, USA / Vereinigte Staaten Dauer: 6 Okt. 1998 → 8 Okt. 1998 |
ASJC Scopus subject areas
- Physik der kondensierten Materie