Metrology & methodology of system level ESD testing

D. Lin; D. Pommerenke; J. Barth; L. G. Henry; H. Hyatt; M. Hopkins; G. Senko; D. Smith

Metrology & methodology of system level ESD testing

D. Lin^*, D. Pommerenke, J. Barth, L. G. Henry, H. Hyatt, M. Hopkins, G. Senko, D. Smith

^*Korrespondierende/r Autor/in für diese Arbeit

Publikation: Beitrag in einer Fachzeitschrift › Konferenzartikel

Abstract

Parameters which cause the poor reproducibility of system level ESD tests have been identified: simulator calibration methodology and insufficient simulator specifications. Results of round robin tests we performed at three laboratories are reported. A better calibration methodology for ESD current measurement and additional simulator specifications for output current and radiated fields are proposed.

Originalsprache	englisch
Seiten (von - bis)	29-39
Seitenumfang	11
Fachzeitschrift	Electrical Overstress Electrostatic Discharge Symposium Proceedings
Publikationsstatus	Veröffentlicht - 1 Dez 1998
Extern publiziert	Ja
Veranstaltung	Proceedings of the 1998 20th Annual International EOS/ESD Symposium - Reno, NV, USA Dauer: 6 Okt 1998 → 8 Okt 1998

ASJC Scopus subject areas

!!Condensed Matter Physics

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@article{b6c8932e34b34ee7bdce9e1e0b16d064,

title = "Metrology & methodology of system level ESD testing",

abstract = "Parameters which cause the poor reproducibility of system level ESD tests have been identified: simulator calibration methodology and insufficient simulator specifications. Results of round robin tests we performed at three laboratories are reported. A better calibration methodology for ESD current measurement and additional simulator specifications for output current and radiated fields are proposed.",

author = "D. Lin and D. Pommerenke and J. Barth and Henry, {L. G.} and H. Hyatt and M. Hopkins and G. Senko and D. Smith",

year = "1998",

month = dec,

day = "1",

language = "English",

pages = "29--39",

journal = "Electrical Overstress Electrostatic Discharge Symposium Proceedings",

issn = "0739-5159",

publisher = "Reliability Analysis Center ",

note = "Proceedings of the 1998 20th Annual International EOS/ESD Symposium ; Conference date: 06-10-1998 Through 08-10-1998",

}

TY - JOUR

T1 - Metrology & methodology of system level ESD testing

AU - Lin, D.

AU - Pommerenke, D.

AU - Barth, J.

AU - Henry, L. G.

AU - Hyatt, H.

AU - Hopkins, M.

AU - Senko, G.

AU - Smith, D.

PY - 1998/12/1

Y1 - 1998/12/1

N2 - Parameters which cause the poor reproducibility of system level ESD tests have been identified: simulator calibration methodology and insufficient simulator specifications. Results of round robin tests we performed at three laboratories are reported. A better calibration methodology for ESD current measurement and additional simulator specifications for output current and radiated fields are proposed.

AB - Parameters which cause the poor reproducibility of system level ESD tests have been identified: simulator calibration methodology and insufficient simulator specifications. Results of round robin tests we performed at three laboratories are reported. A better calibration methodology for ESD current measurement and additional simulator specifications for output current and radiated fields are proposed.

UR - http://www.scopus.com/inward/record.url?scp=0032312442&partnerID=8YFLogxK

M3 - Conference article

AN - SCOPUS:0032312442

SP - 29

EP - 39

JO - Electrical Overstress Electrostatic Discharge Symposium Proceedings

JF - Electrical Overstress Electrostatic Discharge Symposium Proceedings

SN - 0739-5159

T2 - Proceedings of the 1998 20th Annual International EOS/ESD Symposium

Y2 - 6 October 1998 through 8 October 1998

ER -

Metrology & methodology of system level ESD testing

Abstract

ASJC Scopus subject areas

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