Measuring the Temperature Homogeneity Across FIB Lamellae for In Situ TEM Experiments via Raman Scattering in Crystalline Silicon

Publikation: Beitrag in Buch/Bericht/KonferenzbandBeitrag in einem KonferenzbandForschungBegutachtung

Originalspracheenglisch
TitelProceedings-14th Multinational Congress on Microscopy, Belgrad-Serbia, Sept. 15-20 2019
KapitelIT4
Seiten79-80
PublikationsstatusVeröffentlicht - 2019
Veranstaltung14th Multinational Congress on Microscopy - Congress venue Metropol Hotel, Belgrad, Serbien
Dauer: 15 Sep 201920 Sep 2019

Konferenz

Konferenz14th Multinational Congress on Microscopy
KurztitelMCM2019
LandSerbien
OrtBelgrad
Zeitraum15/09/1920/09/19

ASJC Scopus subject areas

  • !!Materials Science(all)

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Dies zitieren

Measuring the Temperature Homogeneity Across FIB Lamellae for In Situ TEM Experiments via Raman Scattering in Crystalline Silicon. / Krisper, Robert; Fitzek, Harald Matthias; Fisslthaler, Evelin; Grogger, Werner.

Proceedings-14th Multinational Congress on Microscopy, Belgrad-Serbia, Sept. 15-20 2019. 2019. S. 79-80.

Publikation: Beitrag in Buch/Bericht/KonferenzbandBeitrag in einem KonferenzbandForschungBegutachtung

Krisper, R, Fitzek, HM, Fisslthaler, E & Grogger, W 2019, Measuring the Temperature Homogeneity Across FIB Lamellae for In Situ TEM Experiments via Raman Scattering in Crystalline Silicon. in Proceedings-14th Multinational Congress on Microscopy, Belgrad-Serbia, Sept. 15-20 2019. S. 79-80, 14th Multinational Congress on Microscopy, Belgrad, Serbien, 15/09/19.
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title = "Measuring the Temperature Homogeneity Across FIB Lamellae for In Situ TEM Experiments via Raman Scattering in Crystalline Silicon",
author = "Robert Krisper and Fitzek, {Harald Matthias} and Evelin Fisslthaler and Werner Grogger",
year = "2019",
language = "English",
pages = "79--80",
booktitle = "Proceedings-14th Multinational Congress on Microscopy, Belgrad-Serbia, Sept. 15-20 2019",

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T1 - Measuring the Temperature Homogeneity Across FIB Lamellae for In Situ TEM Experiments via Raman Scattering in Crystalline Silicon

AU - Krisper, Robert

AU - Fitzek, Harald Matthias

AU - Fisslthaler, Evelin

AU - Grogger, Werner

PY - 2019

Y1 - 2019

M3 - Conference contribution

SP - 79

EP - 80

BT - Proceedings-14th Multinational Congress on Microscopy, Belgrad-Serbia, Sept. 15-20 2019

ER -