Measuring the Temperature Homogeneity Across FIB Lamellae for In Situ TEM Exoeriments via Raman Scattering in Crystalline Silicon

Publikation: Beitrag in Buch/Bericht/KonferenzbandBeitrag in einem KonferenzbandForschung

Originalspracheenglisch
TitelWorkshop Handbook: Program & Abstract
Seiten48
PublikationsstatusVeröffentlicht - Apr 2019
VeranstaltungASEM Workshop 2019 - TU Graz, Graz, Österreich
Dauer: 25 Apr 201926 Apr 2019

Workshop

WorkshopASEM Workshop 2019
KurztitelASEM
LandÖsterreich
OrtGraz
Zeitraum25/04/1926/04/19

ASJC Scopus subject areas

  • !!Materials Science(all)

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Dies zitieren

Measuring the Temperature Homogeneity Across FIB Lamellae for In Situ TEM Exoeriments via Raman Scattering in Crystalline Silicon. / Krisper, Robert; Fitzek, Harald Matthias; Fisslthaler, Evelin; Grogger, Werner.

Workshop Handbook: Program & Abstract. 2019. S. 48.

Publikation: Beitrag in Buch/Bericht/KonferenzbandBeitrag in einem KonferenzbandForschung

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title = "Measuring the Temperature Homogeneity Across FIB Lamellae for In Situ TEM Exoeriments via Raman Scattering in Crystalline Silicon",
author = "Robert Krisper and Fitzek, {Harald Matthias} and Evelin Fisslthaler and Werner Grogger",
year = "2019",
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pages = "48",
booktitle = "Workshop Handbook: Program & Abstract",

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AU - Krisper, Robert

AU - Fitzek, Harald Matthias

AU - Fisslthaler, Evelin

AU - Grogger, Werner

PY - 2019/4

Y1 - 2019/4

M3 - Conference contribution

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BT - Workshop Handbook: Program & Abstract

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