Abstract
The magnetic properties of the materials were studied at relevant length scales. The domain structures in patterned magnetic elements were observed by using Lorentz imaging. It was shown that the advances in the development of the magentic materials depended on the ability to characterize them by a range of electron-optic and X-ray scattering/dichroism techniques.
Originalsprache | englisch |
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Titel | Digests of the Intermag Conference |
Seiten | EB03 |
Publikationsstatus | Veröffentlicht - 1 Dez. 2002 |
Veranstaltung | 2002 IEEE International Magnetics Conference-2002 IEEE INTERMAG - Amsterdam, Niederlande Dauer: 28 Apr. 2002 → 2 Mai 2002 |
Konferenz
Konferenz | 2002 IEEE International Magnetics Conference-2002 IEEE INTERMAG |
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Land/Gebiet | Niederlande |
Ort | Amsterdam |
Zeitraum | 28/04/02 → 2/05/02 |
ASJC Scopus subject areas
- Elektrotechnik und Elektronik