Magnetism and microstructure at relevant length scales: Complementary measurements with electron and photon probes

Kannan M. Krishnan; W. Grogger; G. Kusinski; M. E. Gomez; I. Schuller; E.C. Nelson

Magnetism and microstructure at relevant length scales: Complementary measurements with electron and photon probes

Kannan M. Krishnan^*, W. Grogger, G. Kusinski, M. E. Gomez, I. Schuller, E.C. Nelson

^*Korrespondierende/r Autor/-in für diese Arbeit

Institut für Elektronenmikroskopie und Nanoanalytik (5190)

Publikation: Beitrag in Buch/Bericht/Konferenzband › Beitrag in einem Konferenzband › Begutachtung

Abstract

The magnetic properties of the materials were studied at relevant length scales. The domain structures in patterned magnetic elements were observed by using Lorentz imaging. It was shown that the advances in the development of the magentic materials depended on the ability to characterize them by a range of electron-optic and X-ray scattering/dichroism techniques.

Originalsprache	englisch
Titel	Digests of the Intermag Conference
Seiten	EB03
Publikationsstatus	Veröffentlicht - 1 Dez. 2002
Veranstaltung	2002 IEEE International Magnetics Conference-2002 IEEE INTERMAG - Amsterdam, Niederlande Dauer: 28 Apr. 2002 → 2 Mai 2002

Konferenz

Konferenz	2002 IEEE International Magnetics Conference-2002 IEEE INTERMAG
Land/Gebiet	Niederlande
Ort	Amsterdam
Zeitraum	28/04/02 → 2/05/02

ASJC Scopus subject areas

Elektrotechnik und Elektronik

Andere Dateien und Links

http://www.scopus.com/inward/record.url?scp=0036912476&partnerID=8YFLogxK

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title = "Magnetism and microstructure at relevant length scales: Complementary measurements with electron and photon probes",

abstract = "The magnetic properties of the materials were studied at relevant length scales. The domain structures in patterned magnetic elements were observed by using Lorentz imaging. It was shown that the advances in the development of the magentic materials depended on the ability to characterize them by a range of electron-optic and X-ray scattering/dichroism techniques.",

author = "Krishnan, {Kannan M.} and W. Grogger and G. Kusinski and Gomez, {M. E.} and I. Schuller and E.C. Nelson",

year = "2002",

month = dec,

day = "1",

language = "English",

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booktitle = "Digests of the Intermag Conference",

note = "2002 IEEE International Magnetics Conference-2002 IEEE INTERMAG ; Conference date: 28-04-2002 Through 02-05-2002",

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T1 - Magnetism and microstructure at relevant length scales

T2 - 2002 IEEE International Magnetics Conference-2002 IEEE INTERMAG

AU - Krishnan, Kannan M.

AU - Grogger, W.

AU - Kusinski, G.

AU - Gomez, M. E.

AU - Schuller, I.

AU - Nelson, E.C.

PY - 2002/12/1

Y1 - 2002/12/1

N2 - The magnetic properties of the materials were studied at relevant length scales. The domain structures in patterned magnetic elements were observed by using Lorentz imaging. It was shown that the advances in the development of the magentic materials depended on the ability to characterize them by a range of electron-optic and X-ray scattering/dichroism techniques.

AB - The magnetic properties of the materials were studied at relevant length scales. The domain structures in patterned magnetic elements were observed by using Lorentz imaging. It was shown that the advances in the development of the magentic materials depended on the ability to characterize them by a range of electron-optic and X-ray scattering/dichroism techniques.

UR - http://www.scopus.com/inward/record.url?scp=0036912476&partnerID=8YFLogxK

M3 - Conference paper

AN - SCOPUS:0036912476

SP - EB03

BT - Digests of the Intermag Conference

Y2 - 28 April 2002 through 2 May 2002

ER -

Magnetism and microstructure at relevant length scales: Complementary measurements with electron and photon probes

Abstract

Konferenz

ASJC Scopus subject areas

Andere Dateien und Links

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