| Originalsprache | englisch |
|---|---|
| Publikationsstatus | Veröffentlicht - 25 Apr 2018 |
ASJC Scopus subject areas
- !!Electrical and Electronic Engineering
- !!Radiation
Dies zitieren
Bezhenova, V., & Michalowska-Forsyth, A. M. (2018, Apr 25). Ionizing radiation and radiation hardness in analog integrated circuits - recent X-ray testing.
Ionizing radiation and radiation hardness in analog integrated circuits - recent X-ray testing. / Bezhenova, Varvara; Michalowska-Forsyth, Alicja Malgorzata.
2018, .Publikation: Andere Beiträge › Lehrveranstaltungsskriptum › Forschung
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title = "Ionizing radiation and radiation hardness in analog integrated circuits - recent X-ray testing",
author = "Varvara Bezhenova and Michalowska-Forsyth, {Alicja Malgorzata}",
year = "2018",
month = "4",
day = "25",
language = "English",
type = "Other",
}
TY - GEN
T1 - Ionizing radiation and radiation hardness in analog integrated circuits - recent X-ray testing
AU - Bezhenova, Varvara
AU - Michalowska-Forsyth, Alicja Malgorzata
PY - 2018/4/25
Y1 - 2018/4/25
M3 - Lecture notes
ER -