Investigation of the ESD induced clock disturbances in portable electronic products

Viswa Pilla, Pratik Maheshwari, Tianqi Li, David J. Pommerenke, Junji Maeshima, Hideki Shumiya, Takashi Yamada, Kenji Araki

Publikation: Beitrag in Buch/Bericht/KonferenzbandBeitrag in einem Konferenzband

Abstract

ESD events can induce noise on the system clock which may lead to soft-errors in the portable electronic products. This paper presents measurement techniques to investigate the ESD induced clock disturbances. At first, the soft-errors due to system level ESD testing on a DUT are shown. Next, local field scanning and direct injection are performed to identify ESD sensitive areas/traces. Techniques for soft-error threshold measurement using synchronized noise injection techniques are shown. Short time FFT (STFFT) based spectrogram method to investigate the PLL output frequency deviation due to the clock line noise, is presented.

Originalspracheenglisch
TitelProceedings - 2013 IEEE International Symposium on Electromagnetic Compatibility, EMC 2013
Seiten343-347
Seitenumfang5
DOIs
PublikationsstatusVeröffentlicht - 1 Dez 2013
Extern publiziertJa
Veranstaltung2013 IEEE International Symposium on Electromagnetic Compatibility, EMC 2013 - Denver, CO, USA / Vereinigte Staaten
Dauer: 5 Aug 20139 Aug 2013

Publikationsreihe

NameIEEE International Symposium on Electromagnetic Compatibility
ISSN (Print)1077-4076
ISSN (elektronisch)2158-1118

Konferenz

Konferenz2013 IEEE International Symposium on Electromagnetic Compatibility, EMC 2013
LandUSA / Vereinigte Staaten
OrtDenver, CO
Zeitraum5/08/139/08/13

ASJC Scopus subject areas

  • !!Condensed Matter Physics
  • !!Electrical and Electronic Engineering

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