Abstract
Models of overvoltage protection devices such as voltage suppressor diodes (TVS) are available for the most part in circuit analyzer tools. During the course of investigating the simulation of such protection devices via LTspice in the context of fast transient phenomena some assumptions of those existing models can present problems. This is the case regarding the model of the junction capacitances, especially for the cutoff region when predicting the disturbances generated by those devises.
Originalsprache | englisch |
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Titel | 2018 IEEE Symposium on Electromagnetic Compatibility Signal Integrity and Power Integrity |
Herausgeber (Verlag) | IEEE Publications |
Seiten | 1-1 |
Seitenumfang | 1 |
ISBN (Print) | 978-1-5386-6622-7 |
DOIs | |
Publikationsstatus | Veröffentlicht - 3 Aug. 2018 |
Veranstaltung | 2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity, EMC, SI and PI 2018 - Long Beach, USA / Vereinigte Staaten Dauer: 30 Juli 2018 → 3 Aug. 2018 |
Konferenz
Konferenz | 2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity, EMC, SI and PI 2018 |
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Land/Gebiet | USA / Vereinigte Staaten |
Ort | Long Beach |
Zeitraum | 30/07/18 → 3/08/18 |
Schlagwörter
- Transient analysis
- Integrated circuit modeling
- TV
- Voltage measurement
- Junctions
- Inductance
- Voltage control