Investigation of Spice Models for Overvoltage Protection Devices with Respect to Fast Transients

Publikation: Beitrag in Buch/Bericht/KonferenzbandBeitrag in einem KonferenzbandForschungBegutachtung

Abstract

Models of overvoltage protection devices such as voltage suppressor diodes (TVS) are available for the most part in circuit analyzer tools. During the course of investigating the simulation of such protection devices via LTspice in the context of fast transient phenomena some assumptions of those existing models can present problems. This is the case regarding the model of the junction capacitances, especially for the cutoff region when predicting the disturbances generated by those devises.

Spracheenglisch
Titel2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity, EMC, SI and PI 2018
Herausgeber (Verlag)Institute of Electrical and Electronics Engineers
ISBN (elektronisch)9781538666210
DOIs
StatusVeröffentlicht - 17 Okt 2018
Veranstaltung2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity, EMC, SI and PI 2018 - Long Beach, USA / Vereinigte Staaten
Dauer: 30 Jul 20183 Aug 2018

Konferenz

Konferenz2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity, EMC, SI and PI 2018
LandUSA / Vereinigte Staaten
OrtLong Beach
Zeitraum30/07/183/08/18

Fingerprint

Overvoltage protection
Diodes
Capacitance
Networks (circuits)
Electric potential

Schlagwörter

    ASJC Scopus subject areas

    • !!Safety, Risk, Reliability and Quality
    • !!Signal Processing
    • !!Energy Engineering and Power Technology
    • !!Electrical and Electronic Engineering

    Dies zitieren

    Bauer, S., Renhart, W., Biro, O., Turk, C., Maier, C., Winkler, G., & Deutschmann, B. (2018). Investigation of Spice Models for Overvoltage Protection Devices with Respect to Fast Transients. in 2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity, EMC, SI and PI 2018 [8495349] Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/EMCSI.2018.8495349

    Investigation of Spice Models for Overvoltage Protection Devices with Respect to Fast Transients. / Bauer, Susanne; Renhart, Werner; Biro, Oszkar; Turk, Christian; Maier, Christoph; Winkler, Gunter; Deutschmann, Bernd.

    2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity, EMC, SI and PI 2018. Institute of Electrical and Electronics Engineers, 2018. 8495349.

    Publikation: Beitrag in Buch/Bericht/KonferenzbandBeitrag in einem KonferenzbandForschungBegutachtung

    Bauer, S, Renhart, W, Biro, O, Turk, C, Maier, C, Winkler, G & Deutschmann, B 2018, Investigation of Spice Models for Overvoltage Protection Devices with Respect to Fast Transients. in 2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity, EMC, SI and PI 2018., 8495349, Institute of Electrical and Electronics Engineers, Long Beach, USA / Vereinigte Staaten, 30/07/18. https://doi.org/10.1109/EMCSI.2018.8495349
    Bauer S, Renhart W, Biro O, Turk C, Maier C, Winkler G et al. Investigation of Spice Models for Overvoltage Protection Devices with Respect to Fast Transients. in 2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity, EMC, SI and PI 2018. Institute of Electrical and Electronics Engineers. 2018. 8495349 https://doi.org/10.1109/EMCSI.2018.8495349
    Bauer, Susanne ; Renhart, Werner ; Biro, Oszkar ; Turk, Christian ; Maier, Christoph ; Winkler, Gunter ; Deutschmann, Bernd. / Investigation of Spice Models for Overvoltage Protection Devices with Respect to Fast Transients. 2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity, EMC, SI and PI 2018. Institute of Electrical and Electronics Engineers, 2018.
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    abstract = "Models of overvoltage protection devices such as voltage suppressor diodes (TVS) are available for the most part in circuit analyzer tools. During the course of investigating the simulation of such protection devices via LTspice in the context of fast transient phenomena some assumptions of those existing models can present problems. This is the case regarding the model of the junction capacitances, especially for the cutoff region when predicting the disturbances generated by those devises.",
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