Investigation of Micro-Crack propagation tn the Nickel based alloy 80A during hot forming by 3D-EBSD

Publikation: Beitrag in Buch/Bericht/KonferenzbandBeitrag in einem KonferenzbandForschungBegutachtung

Originalspracheenglisch
TitelElectron Probe Microanalysis of Materials Today
Herausgeber (Verlag).
Seiten358-358
PublikationsstatusVeröffentlicht - 2012
VeranstaltungEuropean Workshop on Modern Developments and Applications in Microbeam Analysis - Padua, Italien
Dauer: 17 Jun 201220 Jun 2012

Konferenz

KonferenzEuropean Workshop on Modern Developments and Applications in Microbeam Analysis
LandItalien
OrtPadua
Zeitraum17/06/1220/06/12

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Dies zitieren

Investigation of Micro-Crack propagation tn the Nickel based alloy 80A during hot forming by 3D-EBSD. / Mitsche, Stefan; Jantscher, Klemens; Sommitsch, Christof; Pölt, Peter.

Electron Probe Microanalysis of Materials Today. ., 2012. S. 358-358.

Publikation: Beitrag in Buch/Bericht/KonferenzbandBeitrag in einem KonferenzbandForschungBegutachtung

Mitsche, S, Jantscher, K, Sommitsch, C & Pölt, P 2012, Investigation of Micro-Crack propagation tn the Nickel based alloy 80A during hot forming by 3D-EBSD. in Electron Probe Microanalysis of Materials Today. ., S. 358-358, Padua, Italien, 17/06/12.
@inproceedings{a6577ce07f0f4ef4b13b4acc9056c920,
title = "Investigation of Micro-Crack propagation tn the Nickel based alloy 80A during hot forming by 3D-EBSD",
author = "Stefan Mitsche and Klemens Jantscher and Christof Sommitsch and Peter P{\"o}lt",
year = "2012",
language = "English",
pages = "358--358",
booktitle = "Electron Probe Microanalysis of Materials Today",
publisher = ".",

}

TY - GEN

T1 - Investigation of Micro-Crack propagation tn the Nickel based alloy 80A during hot forming by 3D-EBSD

AU - Mitsche, Stefan

AU - Jantscher, Klemens

AU - Sommitsch, Christof

AU - Pölt, Peter

PY - 2012

Y1 - 2012

M3 - Conference contribution

SP - 358

EP - 358

BT - Electron Probe Microanalysis of Materials Today

PB - .

ER -