Interface structure studies by atomic resolution microscopy, order-disorder phenomena and atomic diffusion in gas-phase synthesized nanocrystalline solids

H.-E. Schaefer; K. Reimann; W. Straub; F. Phillipp; H. Tanimoto; Ulrich Brossmann; Roland Würschum

Interface structure studies by atomic resolution microscopy, order-disorder phenomena and atomic diffusion in gas-phase synthesized nanocrystalline solids

H.-E. Schaefer, K. Reimann, W. Straub, F. Phillipp, H. Tanimoto, Ulrich Brossmann, Roland Würschum

Institut für Materialphysik (5170)

Publikation: Beitrag in einer Fachzeitschrift › Artikel › Begutachtung

Originalsprache	englisch
Seiten (von - bis)	24-33
Fachzeitschrift	Materials Science and Engineering B
Jahrgang	286
Publikationsstatus	Veröffentlicht - 2000

Fields of Expertise

Advanced Materials Science

Dieses zitieren

@article{d431f7db315b410ea07280a3688d770d,

title = "Interface structure studies by atomic resolution microscopy, order-disorder phenomena and atomic diffusion in gas-phase synthesized nanocrystalline solids",

author = "H.-E. Schaefer and K. Reimann and W. Straub and F. Phillipp and H. Tanimoto and Ulrich Brossmann and Roland W{\"u}rschum",

year = "2000",

language = "English",

volume = "286",

pages = "24--33",

journal = "Materials Science and Engineering B",

issn = "1873-4944",

publisher = "Elsevier B.V.",

}

TY - JOUR

T1 - Interface structure studies by atomic resolution microscopy, order-disorder phenomena and atomic diffusion in gas-phase synthesized nanocrystalline solids

AU - Schaefer, H.-E.

AU - Reimann, K.

AU - Straub, W.

AU - Phillipp, F.

AU - Tanimoto, H.

AU - Brossmann, Ulrich

AU - Würschum, Roland

PY - 2000

Y1 - 2000

M3 - Article

SN - 1873-4944

VL - 286

SP - 24

EP - 33

JO - Materials Science and Engineering B

JF - Materials Science and Engineering B

ER -