In Situ TEM: The Influence of IR Radiation on EDXS a Elevated Sample Temperatures

Publikation: KonferenzbeitragPosterForschung

Originalspracheenglisch
PublikationsstatusVeröffentlicht - 27 Apr 2018
Veranstaltung8th Advanced Electron Microscopy - IMP Lecture Hall, Campus Vienna Biocenter1, Vienna, Österreich
Dauer: 26 Apr 201827 Apr 2018

Konferenz

Konferenz8th Advanced Electron Microscopy
KurztitelASEM
LandÖsterreich
OrtVienna
Zeitraum26/04/1827/04/18

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Dies zitieren

Krisper, R. (2018). In Situ TEM: The Influence of IR Radiation on EDXS a Elevated Sample Temperatures. Postersitzung präsentiert bei 8th Advanced Electron Microscopy, Vienna, Österreich.

In Situ TEM: The Influence of IR Radiation on EDXS a Elevated Sample Temperatures. / Krisper, Robert.

2018. Postersitzung präsentiert bei 8th Advanced Electron Microscopy, Vienna, Österreich.

Publikation: KonferenzbeitragPosterForschung

Krisper, R 2018, 'In Situ TEM: The Influence of IR Radiation on EDXS a Elevated Sample Temperatures' 8th Advanced Electron Microscopy, Vienna, Österreich, 26/04/18 - 27/04/18, .
Krisper R. In Situ TEM: The Influence of IR Radiation on EDXS a Elevated Sample Temperatures. 2018. Postersitzung präsentiert bei 8th Advanced Electron Microscopy, Vienna, Österreich.
Krisper, Robert. / In Situ TEM: The Influence of IR Radiation on EDXS a Elevated Sample Temperatures. Postersitzung präsentiert bei 8th Advanced Electron Microscopy, Vienna, Österreich.
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