In situ nanoscale characterisation of electrical and magnetic properties of 3D nanostructures by combination of AFM, SEM and FIB

C. Schwalb, Johanna Hütner, H. Frerichs, M. Wolff, G. Fantner, Harald Plank

Publikation: Konferenzbeitrag › Abstract

Originalsprache	deutsch
Seiten	515-516
Seitenumfang	2
Publikationsstatus	Veröffentlicht - 2021
Veranstaltung	2021 Microscopy Conference: MC 2021 - Virtuell, Österreich Dauer: 22 Aug. 2021 → 26 Aug. 2021

ASJC Scopus subject areas

@conference{ce7e1de40083474d964abe3dbd9b2fa7,

title = "In situ nanoscale characterisation of electrical and magnetic properties of 3D nanostructures by combination of AFM, SEM and FIB",

author = "C. Schwalb and Johanna H{\"u}tner and H. Frerichs and M. Wolff and G. Fantner and Harald Plank",

year = "2021",

language = "deutsch",

pages = "515--516",

note = "2021 Microscopy Conference : MC 2021, MC 2021 ; Conference date: 22-08-2021 Through 26-08-2021",

}

TY - CONF

T1 - In situ nanoscale characterisation of electrical and magnetic properties of 3D nanostructures by combination of AFM, SEM and FIB

AU - Schwalb, C.

AU - Hütner, Johanna

AU - Frerichs, H.

AU - Wolff, M.

AU - Fantner, G.

AU - Plank, Harald

PY - 2021

Y1 - 2021

M3 - Abstract

SP - 515

EP - 516

T2 - 2021 Microscopy Conference

Y2 - 22 August 2021 through 26 August 2021

ER -