Implementation and Practical Experience with an Automatic Secondary ESD Detection Algorithm

Shubhankar Marathe, Giorgi Maghlakelidze, David Pommerenke, Mike Hertz

Publikation: Beitrag in Buch/Bericht/KonferenzbandBeitrag in einem Konferenzband

Abstract

Secondary ESD from a non-grounded decorative metal structure on an electronic device often leads to very large discharge currents and a fast rise time of less than 400 picoseconds. Due to the proximity of this secondary ESD event to the electronics, it is likely to cause soft failures or latch-up. Secondary ESD can be detected in IEC 61000-4-2 setups by monitoring the currents, charge transfer, and sudden current increases due to the secondary ESD. An algorithm has been implemented in a test setup which automatically detects secondary ESD. However, due to pre-pulses, reignition of sparking within the relay, and other effects, the algorithm may lead to false positives and missed secondary ESD. This paper describes the implementation of the algorithm and presents the results of DUT testing.

Originalspracheenglisch
Titel2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity, EMC, SI and PI 2018
Herausgeber (Verlag)Institute of Electrical and Electronics Engineers
ISBN (elektronisch)9781538666210
DOIs
PublikationsstatusVeröffentlicht - 17 Okt 2018
Extern publiziertJa
Veranstaltung2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity, EMC, SI and PI 2018 - Long Beach, USA / Vereinigte Staaten
Dauer: 30 Jul 20183 Aug 2018

Publikationsreihe

Name2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity, EMC, SI and PI 2018

Konferenz

Konferenz2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity, EMC, SI and PI 2018
LandUSA / Vereinigte Staaten
OrtLong Beach
Zeitraum30/07/183/08/18

ASJC Scopus subject areas

  • !!Safety, Risk, Reliability and Quality
  • !!Signal Processing
  • !!Energy Engineering and Power Technology
  • !!Electrical and Electronic Engineering

Fingerprint Untersuchen Sie die Forschungsthemen von „Implementation and Practical Experience with an Automatic Secondary ESD Detection Algorithm“. Zusammen bilden sie einen einzigartigen Fingerprint.

  • Dieses zitieren

    Marathe, S., Maghlakelidze, G., Pommerenke, D., & Hertz, M. (2018). Implementation and Practical Experience with an Automatic Secondary ESD Detection Algorithm. in 2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity, EMC, SI and PI 2018 [8495425] (2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity, EMC, SI and PI 2018). Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/EMCSI.2018.8495425