Impact of the capacitance of the dielectric on the contact resistance in organic transistors

Karin Zojer, Egbert Zojer, Anton Fernandez Fernandez, Manfred Gruber

Publikation: Beitrag in einer FachzeitschriftArtikelForschungBegutachtung

Originalspracheenglisch
Seiten (von - bis)044002-ff
FachzeitschriftPhysical review applied
Jahrgang4
DOIs
PublikationsstatusVeröffentlicht - 2015

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Theoretical
  • Basic - Fundamental (Grundlagenforschung)

Dies zitieren

Impact of the capacitance of the dielectric on the contact resistance in organic transistors. / Zojer, Karin; Zojer, Egbert; Fernandez Fernandez, Anton; Gruber, Manfred.

in: Physical review applied, Jahrgang 4, 2015, S. 044002-ff.

Publikation: Beitrag in einer FachzeitschriftArtikelForschungBegutachtung

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AU - Zojer, Egbert

AU - Fernandez Fernandez, Anton

AU - Gruber, Manfred

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PY - 2015

Y1 - 2015

U2 - 10.1103/PhysRevApplied.4.044002

DO - 10.1103/PhysRevApplied.4.044002

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SN - 2331-7019

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