| Originalsprache | englisch |
|---|---|
| Titel | 12th Joint Vacuum Conference 10th European Vacuum Conference 7th Annual Meeting of the German Vacuum Society |
| Herausgeber (Verlag) | . |
| Seiten | 58-58 |
| Publikationsstatus | Veröffentlicht - 2008 |
Fields of Expertise
- Advanced Materials Science
Dies zitieren
Fladischer, K., Ernst, W., Reingruber, H., & Holst, B. (2008). Imaging with neutral atoms using a single crystal silicon wafer. in 12th Joint Vacuum Conference 10th European Vacuum Conference 7th Annual Meeting of the German Vacuum Society (S. 58-58). ..
Imaging with neutral atoms using a single crystal silicon wafer. / Fladischer, Katrin; Ernst, Wolfgang; Reingruber, Herbert; Holst, Bodil.
12th Joint Vacuum Conference 10th European Vacuum Conference 7th Annual Meeting of the German Vacuum Society. ., 2008. S. 58-58.Publikation: Beitrag in Buch/Bericht/Konferenzband › Beitrag in einem Konferenzband › Forschung › Begutachtung
Fladischer, K, Ernst, W, Reingruber, H & Holst, B 2008, Imaging with neutral atoms using a single crystal silicon wafer. in 12th Joint Vacuum Conference 10th European Vacuum Conference 7th Annual Meeting of the German Vacuum Society. ., S. 58-58.
Fladischer K, Ernst W, Reingruber H, Holst B. Imaging with neutral atoms using a single crystal silicon wafer. in 12th Joint Vacuum Conference 10th European Vacuum Conference 7th Annual Meeting of the German Vacuum Society. . 2008. S. 58-58
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BT - 12th Joint Vacuum Conference 10th European Vacuum Conference 7th Annual Meeting of the German Vacuum Society
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