Imaging atom probe characterization of STM tips

Alexander Fian, Manfred Leisch

Publikation: Beitrag in Buch/Bericht/KonferenzbandBeitrag in einem KonferenzbandForschungBegutachtung

Originalspracheenglisch
TitelEurophysics conference abstracts ; 24 C
ErscheinungsortParis
Herausgeber (Verlag)European Physical Society
Seiten155-155
PublikationsstatusVeröffentlicht - 2000
VeranstaltungEuropean Conference on Surface Science - Madrid, Spanien
Dauer: 5 Sep 20008 Sep 2000

Konferenz

KonferenzEuropean Conference on Surface Science
LandSpanien
OrtMadrid
Zeitraum5/09/008/09/00

Treatment code (Nähere Zuordnung)

  • Experimental

Dies zitieren

Fian, A., & Leisch, M. (2000). Imaging atom probe characterization of STM tips. in Europhysics conference abstracts ; 24 C (S. 155-155). Paris: European Physical Society.

Imaging atom probe characterization of STM tips. / Fian, Alexander; Leisch, Manfred.

Europhysics conference abstracts ; 24 C. Paris : European Physical Society, 2000. S. 155-155.

Publikation: Beitrag in Buch/Bericht/KonferenzbandBeitrag in einem KonferenzbandForschungBegutachtung

Fian, A & Leisch, M 2000, Imaging atom probe characterization of STM tips. in Europhysics conference abstracts ; 24 C. European Physical Society, Paris, S. 155-155, Madrid, Spanien, 5/09/00.
Fian A, Leisch M. Imaging atom probe characterization of STM tips. in Europhysics conference abstracts ; 24 C. Paris: European Physical Society. 2000. S. 155-155
Fian, Alexander ; Leisch, Manfred. / Imaging atom probe characterization of STM tips. Europhysics conference abstracts ; 24 C. Paris : European Physical Society, 2000. S. 155-155
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