Holistic Analysis for Electrical Capacitance Tomography Front-End Electronics

Publikation: Beitrag in Buch/Bericht/KonferenzbandBeitrag in einem KonferenzbandForschungBegutachtung

Abstract

The design and realization of capacitive measurement systems requires a variety of prior knowledge of the system, to achieve the intended performance. Electrical capacitance tomography (ECT) is a high end application of capacitive sensing.The required electronics is usually tailored to specific application constraints. To compare suitable circuit structures, a holistic design framework is required considering all components and their mutual interactions to derive appropriate figures of merit. We present an analysis framework and exemplary compare two different ECT circuit structures with respect to their sensitivity. The framework incorporates real world sensor conditions, for the application of the system.
Originalspracheenglisch
TitelXXII World Congress of the International Measurement Confederation (IMEKO 2018)
Herausgeber (Verlag)Institute of Physics Publ.
Seitenumfang4
Band1065
DOIs
PublikationsstatusVeröffentlicht - Sep 2018
VeranstaltungXXII World Congress of the International Measurement Confederation - Belfast Waterfront, Belfast, Großbritannien / Vereinigtes Königreich
Dauer: 3 Sep 20186 Sep 2018
Konferenznummer: 22
http://www.imeko2018.org/

Konferenz

KonferenzXXII World Congress of the International Measurement Confederation
KurztitelIMEKO
LandGroßbritannien / Vereinigtes Königreich
OrtBelfast
Zeitraum3/09/186/09/18
Internetadresse

Fingerprint

Tomography
Capacitance
Electronic equipment
Networks (circuits)
Sensors

Dies zitieren

Flatscher, M., Neumayer, M., & Bretterklieber, T. (2018). Holistic Analysis for Electrical Capacitance Tomography Front-End Electronics. in XXII World Congress of the International Measurement Confederation (IMEKO 2018) (Band 1065). Institute of Physics Publ.. https://doi.org/10.1088/1742-6596/1065/9/092008

Holistic Analysis for Electrical Capacitance Tomography Front-End Electronics. / Flatscher, Matthias; Neumayer, Markus; Bretterklieber, Thomas.

XXII World Congress of the International Measurement Confederation (IMEKO 2018). Band 1065 Institute of Physics Publ., 2018.

Publikation: Beitrag in Buch/Bericht/KonferenzbandBeitrag in einem KonferenzbandForschungBegutachtung

Flatscher, M, Neumayer, M & Bretterklieber, T 2018, Holistic Analysis for Electrical Capacitance Tomography Front-End Electronics. in XXII World Congress of the International Measurement Confederation (IMEKO 2018). Bd. 1065, Institute of Physics Publ., Belfast, Großbritannien / Vereinigtes Königreich, 3/09/18. https://doi.org/10.1088/1742-6596/1065/9/092008
Flatscher M, Neumayer M, Bretterklieber T. Holistic Analysis for Electrical Capacitance Tomography Front-End Electronics. in XXII World Congress of the International Measurement Confederation (IMEKO 2018). Band 1065. Institute of Physics Publ. 2018 https://doi.org/10.1088/1742-6596/1065/9/092008
Flatscher, Matthias ; Neumayer, Markus ; Bretterklieber, Thomas. / Holistic Analysis for Electrical Capacitance Tomography Front-End Electronics. XXII World Congress of the International Measurement Confederation (IMEKO 2018). Band 1065 Institute of Physics Publ., 2018.
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