High spatial and energy resolution x-ray analysis of thin specimens by scanning electron microscopy

Publikation: Konferenzbeitrag(Altdaten) Vortrag oder PräsentationForschung

Originalspracheenglisch
PublikationsstatusVeröffentlicht - 3 Mai 2015
VeranstaltungEuropean Workshop on Modern Developments and Applications in Microbeam Analysis - Portoroz, Slowenien
Dauer: 3 Mai 20157 Mai 2015

Konferenz

KonferenzEuropean Workshop on Modern Developments and Applications in Microbeam Analysis
LandSlowenien
OrtPortoroz
Zeitraum3/05/157/05/15

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • My Favorites

Dies zitieren

Mitsche, S., Melischnig, A., Haberfehlner, G., Dienstleder, M., & Pölt, P. (2015). High spatial and energy resolution x-ray analysis of thin specimens by scanning electron microscopy. European Workshop on Modern Developments and Applications in Microbeam Analysis, Portoroz, Slowenien.

High spatial and energy resolution x-ray analysis of thin specimens by scanning electron microscopy. / Mitsche, Stefan; Melischnig, A.; Haberfehlner, Georg; Dienstleder, Martina; Pölt, Peter.

2015. European Workshop on Modern Developments and Applications in Microbeam Analysis, Portoroz, Slowenien.

Publikation: Konferenzbeitrag(Altdaten) Vortrag oder PräsentationForschung

Mitsche S, Melischnig A, Haberfehlner G, Dienstleder M, Pölt P. High spatial and energy resolution x-ray analysis of thin specimens by scanning electron microscopy. 2015. European Workshop on Modern Developments and Applications in Microbeam Analysis, Portoroz, Slowenien.
Mitsche, Stefan ; Melischnig, A. ; Haberfehlner, Georg ; Dienstleder, Martina ; Pölt, Peter. / High spatial and energy resolution x-ray analysis of thin specimens by scanning electron microscopy. European Workshop on Modern Developments and Applications in Microbeam Analysis, Portoroz, Slowenien.
@conference{c20b9111e2af47f084e982a97ada124a,
title = "High spatial and energy resolution x-ray analysis of thin specimens by scanning electron microscopy",
author = "Stefan Mitsche and A. Melischnig and Georg Haberfehlner and Martina Dienstleder and Peter P{\"o}lt",
year = "2015",
month = "5",
day = "3",
language = "English",
note = "European Workshop on Modern Developments and Applications in Microbeam Analysis ; Conference date: 03-05-2015 Through 07-05-2015",

}

TY - CONF

T1 - High spatial and energy resolution x-ray analysis of thin specimens by scanning electron microscopy

AU - Mitsche, Stefan

AU - Melischnig, A.

AU - Haberfehlner, Georg

AU - Dienstleder, Martina

AU - Pölt, Peter

PY - 2015/5/3

Y1 - 2015/5/3

M3 - (Old data) Lecture or Presentation

ER -